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1.
Efficient Test Methodologies for High-Speed Serial Links
Publisher: Springer
No Review Yet
AED363
Binding:
Hardback
Release:
07 Dec 2009
Language:
English
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2.
Efficient Test Methodologies for High-Speed Serial Links
Publisher: Springer
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AED606
Binding:
Paperback
Release:
01 Mar 2012
Language:
English
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3.
Unified Methods for VLSI Simulation and Test Generation
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AED317
Binding:
Hardback
Release:
30 Jun 1989
Language:
English
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4.
Formal Equivalence Checking and Design Debugging
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AED807
Binding:
Hardback
Release:
30 Jun 1998
Language:
English
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5.
Formal Equivalence Checking and Design Debugging
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AED807
Binding:
Paperback
Release:
30 Sep 2012
Language:
English
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6.
Delay Fault Testing for VLSI Circuits
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AED673
Binding:
Paperback
Release:
12 Oct 2012
Language:
English
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7.
Delay Fault Testing for VLSI Circuits
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AED422
Binding:
Hardback
Release:
31 Oct 1998
Language:
English
Available
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8.
Electronic Design Automation
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AED307
Binding:
Hardback
Release:
26 Mar 2009
Language:
English
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9.
Efficient Test Methodologies for High-Speed Serial Links
Publisher: Springer
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
25 Jan 2010
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10.
Electronic Design Automation
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AED0
Binding:
Digital (delivered electronically)
Release:
01 Sep 2008
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11.
Electronic Design Automation
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AED396
Binding:
Digital (delivered electronically)
Release:
01 Jan 2009
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12.
Efficient Test Methodologies for High-Speed Serial Links
Publisher: Springer
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AED88
Binding:
Paperback
Release:
18 Apr 2010
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