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Vishwani D. Agrawal

Vishwani D. Agrawal

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1.
Concurrent and Comparative Discrete Event Simulation
Concurrent and Comparative Discrete Event Simulation
By: Vishwani D. Agrawal, Ernst G. Ulrich, Jack H. Arabian
Publisher: Kluwer Academic Publishers
No Review Yet
AED487
Binding:
Hardback
Release:
31 Dec 1993
Language:
English
Available
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2.
Unified Methods for VLSI Simulation and Test Generation
Unified Methods for VLSI Simulation and Test Generation
By: Vishwani D. Agrawal, Kwang-Ting (Tim) Cheng
Publisher: Kluwer Academic Publishers
No Review Yet
AED487
Binding:
Hardback
Release:
30 Jun 1989
Language:
English
Available
Ships within 14-16 Days Explain..
3.
Concurrent and Comparative Discrete Event Simulation
Concurrent and Comparative Discrete Event Simulation
By: Vishwani D. Agrawal, Ernst G. Ulrich, Jack H. Arabian
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED487
Binding:
Paperback
Release:
27 Sep 2012
Language:
English
Available
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4.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Vishwani D. Agrawal, Manoj Sachdev
Publisher: Kluwer Academic Publishers
No Review Yet
AED607
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
Out of Stock
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5.
Test Generation for Very Large Scale Integration Chips
Test Generation for Very Large Scale Integration Chips
By: Vishwani D. Agrawal, S.C. Seth
Publisher: IEEE Computer Society Press,U.S.
No Review Yet
AED99
Binding:
Hardback
Release:
01 Jan 1988
Language:
English
Out of Stock
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6.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits
By: Vishwani D. Agrawal (Visiting Professor with Rutgers University, Newark, NJ, USA), Michael L. Bushnell (Rutgers University, New Brunswick, NJ, USA)
Publisher: Kluwer Academic Publishers Group
No Review Yet
AED39
Binding:
Digital online
Release:
/12/2000
Language:
English
Out of Stock
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7.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
By: Michael L Bushnell, Vishwani D Agrawal
Publisher: Springer
No Review Yet
AED337
Binding:
Graphic Novel
Release:
01 Jan 2000
Out of Stock
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8.
Concurrent and Comparative Discrete Event Simulation
Concurrent and Comparative Discrete Event Simulation
By: Ernst G Ulrich, Jack H Arabian, Vishwani D Agrawal
Publisher: Springer My Copy UK
No Review Yet
AED96
Binding:
Paperback
Release:
31 Dec 1993
Out of Stock
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