laung terng wang author - Books - 24x7 online bookstore Bookswagon.ae
Logo1
Login & Sign up
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
humburger icon Categories
Close

Refine your Search

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
10 results found
List viewGrid view
Sort By:
1.
VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Cheng-Wen Wu
Publisher: Elsevier Science & Technology
No Review Yet
AED366
Binding:
Hardback
Release:
14 Aug 2006
Language:
English
International Edition
Ships within 22-24 Days Explain..
2.
System-on-Chip Test Architectures
System-on-Chip Test Architectures
By: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Publisher: Elsevier Science & Technology
No Review Yet
AED329
Binding:
Hardback
Release:
08 Jan 2008
Language:
English
International Edition
Ships within 18-20 Days Explain..
3.
Electronic Design Automation
Electronic Design Automation
By: Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) Cheng
Publisher: Elsevier Science & Technology
No Review Yet
AED436
Binding:
Hardback
Release:
26 Mar 2009
Language:
English
International Edition
Ships within 18-20 Days Explain..
4.
Electronic Design Automation
Electronic Design Automation
By: Laung-Terng Wang, Wei Wang, Yao-Wen Chang, Louis Chang, Guan Ang Cheng
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED381
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
5.
VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED427
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Out of Stock
Notify me when this book is in stockNotify Me
6.
System-On-Chip Test Architectures
System-On-Chip Test Architectures
By: Laung-Terng Wang, Nur Touba, Charles E Stroud
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED403
Binding:
Digital (delivered electronically)
Release:
28 May 2008
Out of Stock
Notify me when this book is in stockNotify Me
7.
VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED75
Binding:
Paperback
Release:
21 Jul 2006
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
8.
VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED332
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
9.
System-On-Chip Test Architectures
System-On-Chip Test Architectures
By: Charles Stroud, Laung-Terng Wang, Nur A Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED312
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
10.
Electronic Design Automation
Electronic Design Automation
By: Kwang-Ting Cheng, Laung-Terng Wang, Yao-Wen Chang
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED471
Binding:
Digital (delivered electronically)
Release:
01 Jan 2009
Out of Stock
Notify me when this book is in stockNotify Me
No more records found