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Vishwani Agrawal

Vishwani Agrawal

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1.
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Available
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2.
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
International Edition
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3.
Concurrent and Comparative Discrete Event Simulation
No Review Yet
AED487
Binding:
Paperback
Release:
27 Sep 2012
Language:
English
Available
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4.
Unified Methods for VLSI Simulation and Test Generation
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AED487
Binding:
Hardback
Release:
30 Jun 1989
Language:
English
Available
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5.
Concurrent and Comparative Discrete Event Simulation
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AED487
Binding:
Hardback
Release:
31 Dec 1993
Language:
English
Available
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6.
Neural Models and Algorithms for Digital Testing
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AED487
Binding:
Paperback
Release:
28 Sep 2012
Language:
English
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7.
Neural Models and Algorithms for Digital Testing
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AED487
Binding:
Hardback
Release:
30 Jun 1991
Language:
English
Available
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8.
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Out of Stock
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9.
Defect Oriented Testing for CMOS Analog and Digital Circuits
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AED607
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
Out of Stock
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10.
Test Generation for Very Large Scale Integration Chips
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AED99
Binding:
Hardback
Release:
01 Jan 1988
Language:
English
Out of Stock
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11.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits
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12.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
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13.
Concurrent and Comparative Discrete Event Simulation
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