Buy books written by Manoj Sachdev Available at Bookswagon
Manoj Sachdev

Manoj Sachdev

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1.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Publisher: Springer
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AED766
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
International Edition
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2.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Publisher: Springer
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AED712
Binding:
Paperback
Release:
28 Oct 2010
Language:
English
International Edition
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3.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
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AED718
Binding:
Hardback
Release:
21 Jun 2008
Language:
English
International Edition
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4.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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AED960
Binding:
Hardback
Release:
21 Jun 2007
Language:
English
International Edition
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5.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
International Edition
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6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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AED718
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
International Edition
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7.
Thermal and Power Management of Integrated Circuits
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AED485
Binding:
Paperback
Release:
29 Nov 2010
Language:
English
International Edition
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8.
Thermal and Power Management of Integrated Circuits
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AED285
Binding:
Hardback
Release:
04 Jan 2006
Language:
English
Available
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9.
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
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AED78
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
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10.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.
Publisher: Springer
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AED48
Binding:
Digital (delivered electronically)
Release:
01 Jan 2007
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11.
Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
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AED15
Binding:
Digital (delivered electronically)
Release:
/12/2007
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12.
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
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AED608
Binding:
Digital (delivered electronically)
Release:
01 Jan 2008
Language:
English
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13.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
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14.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
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15.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Publisher: Springer Us
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AED851
Binding:
Undefined
Release:
01 Jan 2007
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16.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Publisher: Springer
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AED105
Binding:
Paperback
Release:
15 Jan 2014
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17.
Thermal and Power Management of Integrated Circuits
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AED486
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Language:
English
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18.
Defect Oriented Testing for CMOS Analog and Digital Circuits
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19.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Publisher: Springer
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AED105
Binding:
Paperback
Release:
17 Jul 2008
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20.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
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