Buy books written by Manoj Sachdev Available at Bookswagon
Logo1
Login & Sign up
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
humburger icon Categories
Close

Refine your Search

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
Manoj Sachdev

Manoj Sachdev

21 results found
List viewGrid view
Sort By:
1.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
AED785
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
2.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer
No Review Yet
AED739
Binding:
Paperback
Release:
28 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
3.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED710
Binding:
Hardback
Release:
21 Jun 2008
Language:
English
International Edition
Ships within 18-20 Days Explain..
4.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, José Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED924
Binding:
Hardback
Release:
21 Jun 2007
Language:
English
International Edition
Ships within 18-20 Days Explain..
5.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED785
Binding:
Hardback
Release:
06 May 2008
Language:
English
Available
Ships within 14-16 Days Explain..
6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, José Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED923
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
7.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED315
Binding:
Hardback
Release:
04 Jan 2006
Language:
English
Available
Ships within 2-4 Days Explain..
8.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED462
Binding:
Paperback
Release:
29 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
9.
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED71
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
10.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.
By: Jos Pineda De Gyvez, Manoj Sachdev
Publisher: Springer
No Review Yet
AED44
Binding:
Digital (delivered electronically)
Release:
01 Jan 2007
Out of Stock
Notify me when this book is in stockNotify Me
11.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Manoj Sachdev
Publisher: Springer
No Review Yet
AED96
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
Notify me when this book is in stockNotify Me
12.
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED555
Binding:
Digital (delivered electronically)
Release:
01 Jan 2008
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
13.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev
Publisher: Springer Us
No Review Yet
AED777
Binding:
Graphic Novel
Release:
01 Jan 2007
Out of Stock
Notify me when this book is in stockNotify Me
14.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
AED667
Binding:
Graphic Novel
Release:
01 Jan 2008
Out of Stock
Notify me when this book is in stockNotify Me
15.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
AED96
Binding:
Paperback
Release:
17 Jul 2008
Out of Stock
Notify me when this book is in stockNotify Me
16.
Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
By: Manoj Sachdev, Jose Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED14
Binding:
Digital (delivered electronically)
Release:
/12/2007
Out of Stock
Notify me when this book is in stockNotify Me
17.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer Us
No Review Yet
AED667
Binding:
Graphic Novel
Release:
01 Jan 2006
Out of Stock
Notify me when this book is in stockNotify Me
18.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Vishwani D. Agrawal, Manoj Sachdev
Publisher: Kluwer Academic Publishers
No Review Yet
AED607
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
19.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer
No Review Yet
AED703
Binding:
Undefined
Release:
01 Jan 2008
Out of Stock
Notify me when this book is in stockNotify Me
20.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED444
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
loadingLoading more results