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Manoj Sachdev

Manoj Sachdev

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1.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
AED762
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
Available
Ships within 14-16 Days Explain..
2.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer
No Review Yet
AED718
Binding:
Paperback
Release:
28 Oct 2010
Language:
English
Available
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3.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED680
Binding:
Hardback
Release:
21 Jun 2008
Language:
English
International Edition
Ships within 10-12 Days Explain..
4.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, José Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED910
Binding:
Hardback
Release:
21 Jun 2007
Language:
English
International Edition
Ships within 18-20 Days Explain..
5.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED762
Binding:
Hardback
Release:
06 May 2008
Language:
English
Available
Ships within 14-16 Days Explain..
6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, José Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED897
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
7.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED449
Binding:
Paperback
Release:
29 Nov 2010
Language:
English
Available
Ships within 14-16 Days Explain..
8.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED477
Binding:
Hardback
Release:
04 Jan 2006
Language:
English
International Edition
Ships within 10-12 Days Explain..
9.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.
By: Jos Pineda De Gyvez, Manoj Sachdev
Publisher: Springer
No Review Yet
AED40
Binding:
Digital (delivered electronically)
Release:
01 Jan 2007
Out of Stock
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10.
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
By: Arman Vassighi, Manoj Sachdev
Publisher: Springer
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
Out of Stock
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11.
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED66
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
Out of Stock
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12.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
AED88
Binding:
Paperback
Release:
17 Jul 2008
Out of Stock
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13.
Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
By: Manoj Sachdev, Jose Pineda de Gyvez
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED13
Binding:
Digital (delivered electronically)
Release:
/12/2007
Out of Stock
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14.
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
Esd Protection Device and Circuit Design for Advanced Cmos Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED511
Binding:
Digital (delivered electronically)
Release:
01 Jan 2008
Language:
English
Out of Stock
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15.
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
By: Manoj Sachdev, Oleg Semenov, Hossein Sarbishaei
Publisher: Springer
No Review Yet
AED613
Binding:
Graphic Novel
Release:
01 Jan 2008
Out of Stock
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16.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev
Publisher: Springer Us
No Review Yet
AED715
Binding:
Graphic Novel
Release:
01 Jan 2007
Out of Stock
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17.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Manoj Sachdev
Publisher: Springer
No Review Yet
AED88
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
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18.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer
No Review Yet
AED88
Binding:
Paperback
Release:
17 Jul 2008
Out of Stock
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19.
Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
By: Vishwani D. Agrawal, Manoj Sachdev
Publisher: Kluwer Academic Publishers
No Review Yet
AED558
Binding:
Hardback
Release:
31 Dec 1997
Language:
English
Out of Stock
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20.
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
By: Andrei Pavlov, Manoj Sachdev
Publisher: Springer
No Review Yet
AED647
Binding:
Undefined
Release:
01 Jan 2008
Out of Stock
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