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Charles E Stroud

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System-on-Chip Test Architectures

By: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba

Publisher: Elsevier Science & Technology

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AED329

Binding:	Hardback
Release:	08 Jan 2008
Language:	English

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A Designer’s Guide to Built-In Self-Test

By: Charles E. Stroud

Publisher: Springer-Verlag New York Inc.

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AED1,011

Binding:	Paperback
Release:	18 Mar 2013
Language:	English

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A Designer’s Guide to Built-In Self-Test

By: Charles E. Stroud

Publisher: Kluwer Academic Publishers

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AED1,011

Binding:	Hardback
Release:	31 May 2002
Language:	English

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A Designer's Guide to Built-In Self-Test

By: Charles E Stroud

Publisher: Springer

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AED973

Binding:	Paperback
Release:	15 Jan 2014

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A Designer's Guide to Built-in Self-Test

By: Charles E. Stroud (Electrical and Computer Engineering, University of North Carolina at Charlotte, USA)

Publisher: Kluwer Academic Publishers Group

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AED511

Binding:	Digital online
Release:	14 May 2014
Language:	English

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System-On-Chip Test Architectures

By: Laung-Terng Wang, Nur Touba, Charles E Stroud

Publisher: Morgan Kaufmann Publishers

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AED403

Binding:	Digital (delivered electronically)
Release:	28 May 2008

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