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1.
High Resolution X-Ray Diffractometry And Topography
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
AED261
Binding:
Paperback
Release:
10 Oct 2019
Language:
English
Available
Ships within 12-14 Days Explain..
2.
High Resolution X-Ray Diffractometry And Topography
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
AED1,040
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
International Edition
Ships within 18-20 Days Explain..
3.
Methods, systems, and media for detecting covert malware
Methods, systems, and media for detecting covert malware
By: Brian M Bowen
Publisher: Independently Published
No Review Yet
AED53
Binding:
Paperback
Release:
28 Dec 2020
Language:
English
Out of Stock
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4.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K Tanner, D Keith Bowen
Publisher: CRC Press
No Review Yet
AED134
Binding:
Undefined
Release:
01 Jan 2006
Out of Stock
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5.
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
By: Brian K Tanner, D Keith Bowen
Publisher: Taylor & Francis Group
No Review Yet
AED191
Binding:
Digital (delivered electronically)
Release:
01 Jan 1998
Out of Stock
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6.
High Resolution X-Ray Diffractometry And Topography
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Inc
No Review Yet
AED387
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
Out of Stock
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7.
High Resolution X-Ray Diffractometry And Topography
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
AED318
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
Out of Stock
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8.
High Resolution X-Ray Diffractometry And Topography
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
AED217
Binding:
Digital (delivered electronically)
Release:
01 Nov 2005
Language:
English
Out of Stock
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9.
High Resolution X-Ray Diffractometry And Topography
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
AED85
Binding:
Digital (delivered electronically)
Release:
01 Nov 2005
Language:
English
Out of Stock
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10.
High Resolution X-Ray Diffractometry And Topography
High Resolution X-Ray Diffractometry And Topography
By: D.K. Bowen, Brian K. Tanner
Publisher: Taylor & Francis Ltd
No Review Yet
AED106
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
Out of Stock
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11.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K. Tanner, D. Keith Bowen
Publisher: Taylor & Francis Inc
No Review Yet
AED745
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
Out of Stock
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