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Brian K. Tanner

Brian K. Tanner

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1.
X-Ray Metrology in Semiconductor Manufacturing
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AED1,096
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
International Edition
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2.
Introduction to the Physics of Electrons in Solids
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AED590
Binding:
Hardback
Release:
30 Mar 1995
Language:
English
International Edition
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3.
Introduction to the Physics of Electrons in Solids
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AED290
Binding:
Paperback
Release:
30 Mar 1995
Language:
English
International Edition
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4.
High Resolution X-Ray Diffractometry And Topography
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AED684
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
Available
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5.
High Resolution X-Ray Diffractometry And Topography
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AED265
Binding:
Paperback
Release:
10 Oct 2019
Language:
English
Available
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6.
X-Ray and Neutron Dynamical Diffraction
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AED190
Binding:
Paperback
Release:
24 Oct 2012
Language:
English
Available
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7.
Introduction to the Physics of Electrons in Solids
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AED71
Binding:
Digital download and online
Release:
05 Jun 2012
Language:
English
Out of Stock
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8.
X-Ray Metrology in Semiconductor Manufacturing
Publisher: CRC Press
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AED113
Binding:
Undefined
Release:
01 Jan 2006
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9.
High Resolution X-Ray Diffractometry and Topography
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AED161
Binding:
Digital (delivered electronically)
Release:
01 Jan 1998
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10.
High Resolution X-Ray Diffractometry And Topography
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AED71
Binding:
Digital (delivered electronically)
Release:
01 Nov 2005
Language:
English
Out of Stock
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11.
High Resolution X-Ray Diffractometry And Topography
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AED325
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
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12.
High Resolution X-Ray Diffractometry And Topography
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AED182
Binding:
Digital (delivered electronically)
Release:
01 Nov 2005
Language:
English
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13.
High Resolution X-Ray Diffractometry And Topography
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AED89
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
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14.
High Resolution X-Ray Diffractometry And Topography
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AED267
Binding:
Digital (delivered electronically)
Release:
05 Feb 1998
Language:
English
Out of Stock
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