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D. Keith Bowen

D. Keith Bowen

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1.
X-Ray Metrology in Semiconductor Manufacturing
Publisher: CRC Press
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AED134
Binding:
Undefined
Release:
01 Jan 2006
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2.
X-Ray Metrology in Semiconductor Manufacturing
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AED764
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
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3.
High Resolution X-Ray Diffractometry and Topography
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AED191
Binding:
Digital (delivered electronically)
Release:
01 Jan 1998
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