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1.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K Tanner, D Keith Bowen
Publisher: CRC Press
No Review Yet
AED134
Binding:
Undefined
Release:
01 Jan 2006
Out of Stock
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2.
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
By: Brian K Tanner, D Keith Bowen
Publisher: Taylor & Francis Group
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AED191
Binding:
Digital (delivered electronically)
Release:
01 Jan 1998
Out of Stock
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3.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K. Tanner, D. Keith Bowen
No Review Yet
AED745
Binding:
Hardback
Language:
English
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