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Stewart E Rauch

Stewart E Rauch

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Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies
By: Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Stewart E Rauch, Timothy D Sullivan (IBM)
Publisher: Wiley-IEEE Press
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AED669
Binding:
Digital (delivered electronically)
Release:
01 Jan 2009
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