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1.
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies
By: Timothy D. Sullivan, Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune
Publisher: John Wiley & Sons Inc
No Review Yet
AED495
Binding:
Hardback
Release:
04 Sep 2009
Language:
English
Available
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2.
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies
By: Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Stewart E Rauch, Timothy D Sullivan (IBM)
Publisher: Wiley-IEEE Press
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AED669
Binding:
Digital (delivered electronically)
Release:
01 Jan 2009
Out of Stock
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3.
Reliability Wearout Mechanisms in Advanced CMOS chnologies
Reliability Wearout Mechanisms in Advanced CMOS chnologies
By: Timothy D. Sullivan, Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune
Publisher: John Wiley and Sons Ltd
No Review Yet
AED697
Binding:
Other digital
Release:
14 Oct 2009
Language:
English
Out of Stock
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