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Moises Padilla

Moises Padilla

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1.
Factor de Transferencia. Un Modulador del Sistema Inmune
Factor de Transferencia. Un Modulador del Sistema Inmune
By: Moises Armides Franco Molina, Cristina Rodriguez Padilla, Reyes Tamez Guerra
Publisher: Libros En Red
No Review Yet
AED127
Binding:
Paperback
Release:
12 Sep 2014
Language:
Spanish
International Edition
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2.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: John Wiley and Sons Ltd
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
30 May 2014
Language:
English
Out of Stock
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3.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: John Wiley and Sons Ltd
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
27 May 2014
Language:
English
Out of Stock
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4.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: John Wiley and Sons Ltd
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
30 May 2014
Language:
English
Out of Stock
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5.
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
By: Manuel Servin, Moises Padilla, J Antonio Quiroga
Publisher: Wiley-vch
No Review Yet
AED386
Binding:
Digital (delivered electronically)
Release:
01 Jan 2014
Out of Stock
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6.
NVI Biblia De Estudio, Dos Tonos Italiano, Azul/crema, Tamano Personal
NVI Biblia De Estudio, Dos Tonos Italiano, Azul/crema, Tamano Personal
By: Athala Jaramillo, Moises Silva, Esteban Fernandez, Luciano Jaramillo, Rene Padilla
Publisher: Vida Publishers
No Review Yet
AED101
Binding:
Leather / fine binding
Release:
06 May 2008
Language:
Spanish
Out of Stock
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7.
Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications
Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
AED611
Binding:
Other digital
Release:
24 Jun 2014
Language:
English
Out of Stock
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8.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
AED321
Binding:
Hardback
Release:
02 Jul 2014
Language:
English
Out of Stock
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