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J. Antonio Quiroga

J. Antonio Quiroga

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1.
Fringe Pattern Analysis for Optical Metrology
Fringe Pattern Analysis for Optical Metrology
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
AED559
Binding:
Hardback
Release:
02 Jul 2014
Language:
English
Available
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2.
Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications
Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications
By: Manuel Servin, J. Antonio Quiroga, Moises Padilla
Publisher: Wiley-VCH Verlag GmbH
No Review Yet
AED727
Binding:
Other digital
Release:
24 Jun 2014
Language:
English
Out of Stock
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3.
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
By: Manuel Servin, Moises Padilla, J Antonio Quiroga
Publisher: Wiley-vch
No Review Yet
AED460
Binding:
Digital (delivered electronically)
Release:
01 Jan 2014
Out of Stock
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