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David C Joy

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Subaltern Historiography

By: David C I Joy

Publisher: Indian Society for Promoting Christian Knowledge

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AED116

Binding:	Paperback
Release:	17 Jan 2021
Language:	English

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Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph R. Michael, Joseph I. Goldstein, David C. Joy, John Henry J. Scott

Publisher: Springer-Verlag New York Inc.

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AED509

Binding:	Hardback
Release:	18 Nov 2017
Language:	English

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Principles of Analytical Electron Microscopy

By: Joseph Goldstein, David C Joy, Alton D Romig Jr

Publisher: Springer

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AED236

Binding:	Paperback
Release:	15 Jan 2014
Language:	English

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Helium Ion Microscopy

By: David C. Joy

Publisher: Springer-Verlag New York Inc.

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AED231

Binding:	Paperback
Release:	14 Sep 2013
Language:	English

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Introduction to Electron Holography

By: Lawrence F. Allard, David C. Joy, Edgar Völkl

Publisher: Springer-Verlag New York Inc.

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AED462

Binding:	Paperback
Release:	23 Oct 2012
Language:	English

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Principles of Analytical Electron Microscopy

By: Alton D. Romig Jr., Joseph Goldstein, David C. Joy

Publisher: Springer Science+Business Media

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AED693

Binding:	Hardback
Release:	31 Jul 1986
Language:	English

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Principles of Analytical Electron Microscopy

By: Alton D. Romig Jr., Joseph Goldstein, David C. Joy

Publisher: Springer-Verlag New York Inc.

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AED693

Binding:	Paperback
Release:	08 Jul 2013
Language:	English

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Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Charles Fiori, Joseph Goldstein, Patrick Echlin, David C. Joy

Publisher: Springer-Verlag New York Inc.

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AED462

Binding:	Paperback
Release:	20 Mar 2013
Language:	English

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori

Publisher: Springer Science+Business Media

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AED234

Binding:	Hardback
Release:	31 Mar 1986
Language:	English

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10.

Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph R. Michael, Joseph I. Goldstein, David C. Joy, John Henry J. Scott

Publisher: Springer-Verlag New York Inc.

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AED462

Binding:	Paperback
Release:	30 Aug 2018
Language:	English

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11.

Monte Carlo Modeling for Electron Microscopy and Microanalysis

By: David C. Joy

Publisher: Oxford University Press Inc

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AED743

Binding:	Hardback
Release:	15 Jun 1995
Language:	English

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12.

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori

Publisher: Springer-Verlag New York Inc.

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AED479

Binding:	Paperback
Release:	08 Jun 2013
Language:	English

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13.

Scanning Electron Microscopy and X-Ray Microanalysis

By: Goldstein Joseph Goldstein, Newbury Dale E. Newbury, Joy David C. Joy

Publisher: Springer Nature B.V.

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AED250

Binding:	Paperback
Release:	01 Sep 2011
Language:	English

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14.

Helium Ion Microscopy

By: David C Joy

Publisher: Springer

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AED96

Binding:	Paperback
Release:	30 Sep 2013

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15.

Monte Carlo Modeling for Electron Microscopy and Microanalysis

By: David C Joy

Publisher: Oxford University Press

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AED676

Binding:	Digital (delivered electronically)
Release:	/12/1995
Language:	English

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16.

Transforming Praxis

By: C. David Joy

Publisher: Indian Society for Promoting Christian Knowledge

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AED87

Binding:	Paperback
Release:	01 Sep 2008

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17.

Not by Might But My Spirit

By: C. David Joy

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AED36

Binding:

Paperback

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18.

Revelation

By: C.I.David Joy

Publisher: Indian Society for Promoting Christian Knowledge

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AED31

Binding:	Paperback
Release:	01 Aug 2002

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19.

Introduction to Electron Holography

By: Edgar Volkl, David C Joy, Lawrence F Allard

Publisher: Springer

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AED96

Binding:	Paperback
Release:	15 Jan 2014

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20.

Investigation of Methods for Producing Joint CBC-BBS Trends

By: Stuart Newson, David G. Noble, Andrew C. Joys

Publisher: British Trust for Ornithology

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AED26

Binding:	Spiral bound
Release:	01 Apr 2005

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