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C. David Joy

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Subaltern Historiography

By: David C I Joy

Publisher: Indian Society for Promoting Christian Knowledge

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AED125

Binding:	Paperback
Release:	17 Jan 2021
Language:	English

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Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph R. Michael, Joseph I. Goldstein, David C. Joy, John Henry J. Scott

Publisher: Springer-Verlag New York Inc.

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AED494

Binding:	Hardback
Release:	18 Nov 2017
Language:	English

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Principles of Analytical Electron Microscopy

By: Joseph Goldstein, David C Joy, Alton D Romig Jr

Publisher: Springer

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AED240

Binding:	Paperback
Release:	15 Jan 2014
Language:	English

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Helium Ion Microscopy

By: David C. Joy

Publisher: Springer-Verlag New York Inc.

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AED225

Binding:	Paperback
Release:	14 Sep 2013
Language:	English

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Monte Carlo Modeling for Electron Microscopy and Microanalysis

By: David C. Joy

Publisher: Oxford University Press Inc

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AED728

Binding:	Hardback
Release:	15 Jun 1995
Language:	English

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Introduction to Electron Holography

By: Lawrence F. Allard, David C. Joy, Edgar Völkl

Publisher: Springer-Verlag New York Inc.

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AED449

Binding:	Paperback
Release:	23 Oct 2012
Language:	English

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Principles of Analytical Electron Microscopy

By: Alton D. Romig Jr., Joseph Goldstein, David C. Joy

Publisher: Springer Science+Business Media

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AED673

Binding:	Hardback
Release:	31 Jul 1986
Language:	English

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Principles of Analytical Electron Microscopy

By: Alton D. Romig Jr., Joseph Goldstein, David C. Joy

Publisher: Springer-Verlag New York Inc.

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AED673

Binding:	Paperback
Release:	08 Jul 2013
Language:	English

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Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Charles Fiori, Joseph Goldstein, Patrick Echlin, David C. Joy

Publisher: Springer-Verlag New York Inc.

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AED449

Binding:	Paperback
Release:	20 Mar 2013
Language:	English

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10.

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori

Publisher: Springer-Verlag New York Inc.

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AED469

Binding:	Paperback
Release:	08 Jun 2013
Language:	English

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11.

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori

Publisher: Springer Science+Business Media

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AED241

Binding:	Hardback
Release:	31 Mar 1986
Language:	English

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12.

Scanning Electron Microscopy and X-Ray Microanalysis

By: Dale E. Newbury, Joseph R. Michael, Joseph I. Goldstein, David C. Joy, John Henry J. Scott

Publisher: Springer-Verlag New York Inc.

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AED449

Binding:	Paperback
Release:	30 Aug 2018
Language:	English

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13.

Overlooked Voices

By: C I David Joy

Publisher: Borderless Press

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AED64

Binding:	Paperback
Release:	19 Sep 2015
Language:	English

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14.

Scanning Electron Microscopy and X-Ray Microanalysis

By: Goldstein Joseph Goldstein, Newbury Dale E. Newbury, Joy David C. Joy

Publisher: Springer Nature B.V.

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AED230

Binding:	Paperback
Release:	01 Sep 2011
Language:	English

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15.

Transforming Praxis

By: C. David Joy

Publisher: Indian Society for Promoting Christian Knowledge

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AED80

Binding:	Paperback
Release:	01 Sep 2008

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16.

Not by Might But My Spirit

By: C. David Joy

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AED33

Binding:

Paperback

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17.

Monte Carlo Modeling for Electron Microscopy and Microanalysis

By: David C Joy

Publisher: Oxford University Press

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AED622

Binding:	Digital (delivered electronically)
Release:	/12/1995
Language:	English

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18.

Helium Ion Microscopy

By: David C Joy

Publisher: Springer

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AED88

Binding:	Paperback
Release:	30 Sep 2013

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19.

Revelation

By: C.I.David Joy

Publisher: Indian Society for Promoting Christian Knowledge

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AED29

Binding:	Paperback
Release:	01 Aug 2002

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20.

Introduction to Electron Holography

By: Edgar Volkl, David C Joy, Lawrence F Allard

Publisher: Springer

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AED88

Binding:	Paperback
Release:	15 Jan 2014

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