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1.
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies
By: Timothy D. Sullivan, Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune
Publisher: John Wiley & Sons Inc
No Review Yet
AED495
Binding:
Hardback
Release:
04 Sep 2009
Language:
English
Available
Ships within 4-6 Days Explain..
2.
Flax-management Practices in Imperial Valley, With World Statistics; B641
Flax-management Practices in Imperial Valley, With World Statistics; B641
By: G Alvin 1910- Carpenter, H Lee (Herman Lee) 1903- Landerman, Wallace 1887- Sullivan
No Review Yet
AED73
Binding:
Paperback
Language:
English
International Edition
Ships within 12-14 Days Explain..
3.
The Dial, Two Author Indexes
The Dial, Two Author Indexes
By: Alvin Sullivan, Nicholas Joost
Publisher: Southern Illinois University Press
No Review Yet
AED19
Binding:
Paperback
Release:
01 Jan 1971
Language:
English
Out of Stock
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4.
D. H. Lawrence and The Dial
D. H. Lawrence and The Dial
By: Alvin Sullivan, Nicholas Joost
Publisher: Southern Illinois University Press
No Review Yet
AED49
Binding:
Hardback
Release:
01 Jun 1970
Language:
English
Out of Stock
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5.
Reliability Wearout Mechanisms in Advanced CMOS chnologies
Reliability Wearout Mechanisms in Advanced CMOS chnologies
By: Timothy D. Sullivan, Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune
Publisher: John Wiley and Sons Ltd
No Review Yet
AED697
Binding:
Other digital
Release:
14 Oct 2009
Language:
English
Out of Stock
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