Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures
Home > Sciences & Environment > Earth sciences > Geology, geomorphology and the lithosphere > Petrology, petrography and mineralogy > Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures
Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures

Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures


     0     
5
4
3
2
1



International Edition


X
About the Book

The decision of Springer-Verlag to publish this book in English came as a pleasant surprise. The fact is that I started writing the first version of the book back in 1978. I wished to attract attention to potentialities inherent in selected-area electron diffraction (SAED) which, for various reasons, were not being put to use. By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book. There were several aspects concerning these data that I wished to emphasize. First, it was mostly new and understudied minerals that possess the peculiar structural features studied by SAED and HREM. This could interest mineralogists, crystallo­ chemists, and crystallographers. Second, the results obtained indi­ cated that, under certain conditions, SAED could be an effective, and sometimes the only possible, method for structure analysis of minerals. This inference was of primary importance, since fine dispersion and poor crystallinity of numerous natural and synthe­ tic minerals makes their structure study by conventional diffrac­ tion methods hardly possible. Third, it was demonstrated that in many cases X-ray powder diffraction analysis of dispersed miner­ als ought to be combined with SAED and local energy dispersion analysis. This was important, since researchers in structural min­ eralogy quite often ignored, and still ignore even the simplest in­ formation which is readily available from geometrical analysis of SAED patterns obtained from microcrystals.

Table of Contents:
1 Geometrical Features of the Crystal and the Reciprocal Lattices.- 1.1 Crystal Structure and Crystal Lattice.- 1.2 The Bragg Equation. Reciprocal Lattice. Relationships Between the Indices of Lines and Planes in the Direct and Reciprocal Lattices.- 1.3 The Ewald Sphere and the Geometrical Interpretation for Diffraction Patterns.- 2 The Kinematical Theory of Scattering of Electrons by Crystals. Intensity of Diffraction Reflections.- 2.1 Wave-Like Properties of Electrons.- 2.2 The Kinematical Theory of Scattering of Waves by Crystals.- 2.3 Behavior of Electrons in Medium, the Schrödinger Equation, Its Solution in the Kinematical Approximation.- 2.4 Atomic Scattering Amplitudes, or f-Curves.- 2.5 Structure Amplitude and Structure Factor.- 2.6 Reflection Intensities in Point Electron Diffraction Patterns in Terms of the Kinematical Approximation.- 3 Geometrical Analysis of Point Electron-Diffraction Patterns.- 3.1 Raypath in a Transmission Electron Microscope for Imaging and Selected Area Diffraction.- 3.2 Methods for Interpretation of Point Diffraction Patterns: Indexing and Determination of Unit Cells.- 3.3 Simulation of Diffraction Patterns for Objects with Known Unit Cell and Space Symmetry.- 3.4 Interpretation and Simulation of Diffraction Patterns for Triclinic Lattices with a Fixed Coordinate Plane.- 3.5 Determination of the Bravais Cell and the Space Group. Secondary Diffraction Effects.- 4 Diffraction Methods in Structure Analysis.- 4.1 Fourier Series and Integrals: Their Role in the Theory of Diffraction.- 4.2 Fourier Series: Representation for the Electrostatic Potential and Use in Structure Analysis.- 4.3 The Trial-And-Error Method.- 4.4 Interatomic Vector Space. Patterson Function: Properties and Application to Structure Analysis.- 4.5 Direct PhasingMethods.- 4.6 Refinement of Atomic Coordinates by the Least-Squares Method.- 5 Dynamical Theory of Electron Diffraction (Two-Beam Approximation).- 5.1 Quantum-Mechanical Solution.- 5.2 Integrated Diffraction Intensity in Terms of the Two-Beam Dynamical Theory.- 5.3 Criteria for the Range of Validity of the Kinematical Approximation.- 6 Dynamical n-Beam Scattering of Electrons.- 6.1 The “Physical Optics” Approach.- 6.2 Numerical Methods for Calculation of Diffraction Patterns.- 7 Electron Diffraction and High-Resolution Electron Microscopy.- 7.1 Diffraction Effects and Formation of High-Resolution Electron-Microscopic Images.- 7.2 Fraunhofer Diffraction: An Intermediate Stage in the Transfer of Information Between the Object and the Image.- 7.3 Factors Defining the Contrast in Electron-Microscopic Images.- 7.4 Contrast in Electron-Microscopic Images of Thin Crystals.- 7.5 Direct Crystal Structure Determination Methods Under the WPOA.- 7.6 High-Resolution Electron Microscopy (HREM) of Crystals.- 7.7 HREM and Real Structure of Crystals.- 7.8 Simulation of HREM Images.- 7.9 High-Resolution High-Voltage Electron Microscopy (HRHVEM).- 8 Oblique-Texture Electron Diffraction.- 8.1 General.- 8.2 OTED Patterns: Peculiarities of Geometrical Arrangement of Reflections and Integrated Intensities.- 8.3 Two-Dimensional Intensity Distribution in OTED Patterns.- 8.4 Factors Affecting Diffracted Intensities.- 8.5 A Technique for OTED Intensity Measurements.- 8.6 Crystal Structure Refinements of Mica Polytypes on the Basis of Electronometric Intensity Measurement.- 8.7 Determination of Hydrogen Positions in Mica Structures by OTED.- 8.8 Study of Octahedral Cation Distribution in 2:1 Layers of Dioctahedral Smectites.- 9 SAED and HREM Study of Mixed-Layer Minerals.- 9.1Hybrid-Structure Minerals.- 9.2 Structure Analysis of Hybrid Minerals.- 9.3 Crystal Structure of Tochilinite.- 9.4 Structure Analysis of Minerals Related to Tochilinite.- 9.5 The Crystal Structure of Valleriite.- 9.6 A Three-Component Hybrid Mineral Containing Brucite- Like, Sulfide and Silicate Layers.- 9.7 Forms of Structural Heterogeneity.- 9.8 Structure Study of Asbolanes.- 9.9 Analysis of Basal Reflection Intensities in SAED Studies of Mixed-Layer Minerals.- 9.10 Structure Studies of Mixed-Layer Minerals by HREM.- 10 SAED and HREM Study of Order/Disorder and Structural Heterogeneity in Layer Minerals.- 10.1 A New Mica NaMg3(Si3.5Mg0.5)O10(OH)2 Having a Talc- Like Stacking Sequence.- 10.2 Diffraction Effects from Layer Structures Having Partially Ordered Cation Distribution.- 10.3 Structural Modulations Resulting from the Lateral Misfit of Octahedral and Tetrahedral Sheets in Phyllosilicates.- 11 Chain Silicates. New Structural Types: Multiple-Chain and Mixed-Chain Minerals.- 11.1 New Problems in the Structure Study of Chain Silicates.- 11.2 Pyroxenes and Amphiboles: Idealized Structures.- 11.3 Fluorocupfferite Mg7 [Si8O22F2], a New Amphibole Variety.- 11.4 Crystal Structures of Triple-Chain Silicates.- 11.5 New Minerals Having Regular Mixed-Chain Structures.- 11.6 Some Methodological Aspects in the Interpretation for Point SAED Patterns from Chain Silicates.- 11.7 Direct HREM Observation of the Structural Motif of Asbestiform Chain Silicates.- 11.8 Chain-Width Disorder in Chain Silicates.- 11.9 Contrast Distribution in a-Axis HREM Images for Chain- Silicate Crystals Having Chain-Width Disorder.- 11.10 Structural Features of Chain Silicates Revealed in c-Axis HREM Images.- References.


Best Sellers


Product Details
  • ISBN-13: 9783642717314
  • Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
  • Publisher Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • Height: 244 mm
  • No of Pages: 304
  • Returnable: N
  • ISBN-10: 3642717314
  • Publisher Date: 17 Nov 2011
  • Binding: Paperback
  • Language: English
  • Returnable: N
  • Width: 170 mm


Similar Products

Add Photo
Add Photo

Customer Reviews

REVIEWS      0     
Click Here To Be The First to Review this Product
Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG -
Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures
Writing guidlines
We want to publish your review, so please:
  • keep your review on the product. Review's that defame author's character will be rejected.
  • Keep your review focused on the product.
  • Avoid writing about customer service. contact us instead if you have issue requiring immediate attention.
  • Refrain from mentioning competitors or the specific price you paid for the product.
  • Do not include any personally identifiable information, such as full names.

Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures

Required fields are marked with *

Review Title*
Review
    Add Photo Add up to 6 photos
    Would you recommend this product to a friend?
    Tag this Book Read more
    Does your review contain spoilers?
    What type of reader best describes you?
    I agree to the terms & conditions
    You may receive emails regarding this submission. Any emails will include the ability to opt-out of future communications.

    CUSTOMER RATINGS AND REVIEWS AND QUESTIONS AND ANSWERS TERMS OF USE

    These Terms of Use govern your conduct associated with the Customer Ratings and Reviews and/or Questions and Answers service offered by Bookswagon (the "CRR Service").


    By submitting any content to Bookswagon, you guarantee that:
    • You are the sole author and owner of the intellectual property rights in the content;
    • All "moral rights" that you may have in such content have been voluntarily waived by you;
    • All content that you post is accurate;
    • You are at least 13 years old;
    • Use of the content you supply does not violate these Terms of Use and will not cause injury to any person or entity.
    You further agree that you may not submit any content:
    • That is known by you to be false, inaccurate or misleading;
    • That infringes any third party's copyright, patent, trademark, trade secret or other proprietary rights or rights of publicity or privacy;
    • That violates any law, statute, ordinance or regulation (including, but not limited to, those governing, consumer protection, unfair competition, anti-discrimination or false advertising);
    • That is, or may reasonably be considered to be, defamatory, libelous, hateful, racially or religiously biased or offensive, unlawfully threatening or unlawfully harassing to any individual, partnership or corporation;
    • For which you were compensated or granted any consideration by any unapproved third party;
    • That includes any information that references other websites, addresses, email addresses, contact information or phone numbers;
    • That contains any computer viruses, worms or other potentially damaging computer programs or files.
    You agree to indemnify and hold Bookswagon (and its officers, directors, agents, subsidiaries, joint ventures, employees and third-party service providers, including but not limited to Bazaarvoice, Inc.), harmless from all claims, demands, and damages (actual and consequential) of every kind and nature, known and unknown including reasonable attorneys' fees, arising out of a breach of your representations and warranties set forth above, or your violation of any law or the rights of a third party.


    For any content that you submit, you grant Bookswagon a perpetual, irrevocable, royalty-free, transferable right and license to use, copy, modify, delete in its entirety, adapt, publish, translate, create derivative works from and/or sell, transfer, and/or distribute such content and/or incorporate such content into any form, medium or technology throughout the world without compensation to you. Additionally,  Bookswagon may transfer or share any personal information that you submit with its third-party service providers, including but not limited to Bazaarvoice, Inc. in accordance with  Privacy Policy


    All content that you submit may be used at Bookswagon's sole discretion. Bookswagon reserves the right to change, condense, withhold publication, remove or delete any content on Bookswagon's website that Bookswagon deems, in its sole discretion, to violate the content guidelines or any other provision of these Terms of Use.  Bookswagon does not guarantee that you will have any recourse through Bookswagon to edit or delete any content you have submitted. Ratings and written comments are generally posted within two to four business days. However, Bookswagon reserves the right to remove or to refuse to post any submission to the extent authorized by law. You acknowledge that you, not Bookswagon, are responsible for the contents of your submission. None of the content that you submit shall be subject to any obligation of confidence on the part of Bookswagon, its agents, subsidiaries, affiliates, partners or third party service providers (including but not limited to Bazaarvoice, Inc.)and their respective directors, officers and employees.

    Accept

    New Arrivals


    Inspired by your browsing history


    Your review has been submitted!

    You've already reviewed this product!