High Energy Electron Diffraction and Microscopy: (61 Monographs on the Physics and Chemistry of Materials)

This book provides the reader with a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.

Table of Contents:
1. Basic concepts ; 2. Kinematic theory ; 3. Dynamical theory I - general theory ; 4. Dynamical theory II - THEED ; 5. Reflection high energy electron diffraction ; 6. Resonance effects in diffraction ; 7. Diffuse and inelastic scattering - elementary processes ; 8. Diffuse and inelastric scattering - multiple scattering effects ; 9. Crystal and diffraction symmetry ; 10. Perturbation methods and tensor theory ; 11. Digital electron microscopy ; 12. Image formation and the retrieval of the wave function ; 13. The atomic scattering factor and the optical potential ; 14. Debye-Waller factors ; 15. Some useful mathematical relations ; 16. Green's functions ; 17. FORTRAN listing of RHEED routines ; 18. Parameterization of the atomic scattering factor

About the Author :
L.-M. Peng, Yangtze Professor of Nanoscale Science and Technology at Peking University; elected Fellow of Institute of Physics in 2000 and awarded the Qiu Shi Prize for Outstanding Young Scientist in Physics in 1998. Currently serves as an Associate Editor of the "International Journal of Nanoscience", a member of the Advisory Editorial Board of Ultramicroscopy and a member of the Editorial Board, MICRON. S.L.Dudarev, Principal Scientist at EURATOM/UKAEA Fusion Association and Senior Research Fellow of Linacre College, Oxford. Received DSc in Theoretical and Mathematical Physics from Moscow Engineering Physics Institute in 1994. Held visiting positions at Melbourne University, Max-Planck Institute for Solid State Research in Stuttgart and Hong-Kong Polytechnic University. Currently involved in the development of a comprehensive programme on mathematical modelling of fusion materials. M.J.Whelan, FRS, Emeritus Professor of Microscopy of Materials in the Department of Materials, Oxford University. Emeritus Fellow of Linacre College, Oxford.

Review :
Although the book is mathematically based, the authors take care to provide a physical interpretation whenever possible, for example by the use of diagrams. The book is hardbound in Oxford blue and looks like the scholarly reference that it is. The serious electron microscopist will find it a sound investment. This is a superb book. It is certainly the most thorough, unified and comprehensive treatment of high-energy electron diffraction (HEED) theory to appear for many years. In summary this is a book that all laboratories working in electron microscopy and surface science must have. It is also a highly readable textbook, which is unusually clearly written and complete. ... provides a clear treatment of the multiple inelastic scattering that forms the background in electron diffraction (and so limits accuracy), the book is a major step along the road towards accurate quantification of electron diffraction data. This is a book for microscopists who seek to step out of the daily routine and try something new. For £69.95, it represents an excellent deal. ... has the potential to become one of the classic reference books in electron microscopy. This new book, written by three distinguished scholars who worked together in Oxford during the 1990s, is in part a summation of their valuable contributions to the theory of electron diffraction and image formation in the TEM. It nicely complements other reference books that are available ... The serious electron microscopist will find it a sound investment.