CdTe and CdZnTe Materials: Material Properties and Applications

This book provides readers with a good overview of some of most recent advances in the field of CdTe and CdZnTe detector technology for medical imaging, industrial testing and security scanning, especially as it pertains to new applications. There will be a good mixture of general chapters in both technology and applications inthe X-ray testing. The book will have an in-depth review of the research topics from leading world specialists in the field. The conversion of the X-ray and gamma-ray signal into analogue/digital value will be covered in some chapters. Some would also provide a review of CMOS chips for CdTe and CdZnTe image sensors. This book serves as an excellent reference for people already working in the field as well as for people wishing to enter it.

Introduction to CdTe/CZT Physics and Applications.- Dislocation Filtering Layers for Defect Reduction in Heteroepitaxial Grown Dislocation Filtering Layers for Defect Reduction in Heteroepitaxial Growth of Infrared Optoelectronic Materials.- Explicit processing steps on melt growth of stoichiometric Cd0.80Zn0.20Te crystal for high-energy radiation detector.- High-Z material properties 3-Dimensional Mapping of Carrier Lifetime and Mobility using the 3D CZT Drift Strip Detector.- Study of transient current distortion in CZT detectors based on Sentaurus TCAD.- Evaluation on the performance of CZT detector in alpha particle detection with experiment and simulation.- CdZnTeSe: Recent advances for radiation detector applications.- Advancements in CdZnTe Detectors: Overcoming Challenges through Physical and Digital Correction Techniques.- High-resolution 3D CdZnTe drift strip detectors for astrophysical and medical applications.- Compton imaging system based on CdZnTe/CdTe detectors.- Enhanced γ-ray imaging utilizing coded apertures with pixelated detectors.- Ring configured cadmium zinc telluride gamma cameras: Clinical experience and implementation.- CZT Physics-Based Photon Counting Detector Modeling and Calibration for Non-Destructive Testing (NDT).- Impact of blurring correction method in quantitative image analysis using energy-resolving photon counting detector (ERPCD).

Krzysztof (Kris) Iniewski is a director of development architecture and applications at Redlen Technologies Inc. in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CdZnTe detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.

Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 25+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.