Buy Characterization of Crystal Growth Defects by X-Ray Methods
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Home > Science, Technology & Agriculture > Mechanical engineering and materials > Materials science > Testing of materials > Characterization of Crystal Growth Defects by X-Ray Methods: (63 NATO Science Series B:)
36%
Characterization of Crystal Growth Defects by X-Ray Methods: (63 NATO Science Series B:)

Characterization of Crystal Growth Defects by X-Ray Methods: (63 NATO Science Series B:)


     0     
5
4
3
2
1



Available


X
About the Book

This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

Table of Contents:
1 Industrial Implications of Crystal Quality.- 2 The Technical Importance of Growth Defects.- 3 Defects and their Detectability in Melt-Grown Crystals.- 4 Defects and Their Detectability.- 5 Defect Generation in Metal Crystals.- 6 Defects in Non-metal Crystals.- 7 Defect Visualisation: Individual Defects.- 8 Experimental Techniques for the Study of Statistically Distributed Defects.- 9 Elementary Dynamical Theory.- 10 Perfect and Imperfect Crystals.- 11 X-ray Sources.- 12 X-ray Detectors.- 13 Sample Preparation.- 14 Laboratory Techniques for X-ray Reflection Topography.- 15 Laboratory Techniques for Transmission X-ray Topography.- 16 White Beam Synchrotron Radiation Topography.- 17 Control of Wavelength, Polarization, Time-Structure and Divergence for Synchrotron Radiation Topography.- 18 Monochromatic Synchrotron Radiation Topography.- 19 Environmental Stages and Dynamic Experiments.- 20 Technology and Costs of X-Ray Diffraction Topography.- 21 X-Ray TV Imaging and Real-Time Experiments +.- 22 Computer Modelling of Crystal Growth and Dissolution.- 23 Microradiography and Absorption Microscopy.- 24 Reciprocal Lattice Spike Topography.- 25 Reflection Topography: Panel Discussion.- Appendix I Designing a Topographic Experiment.- Appendix 2 Defects and Artifacts.- Appendix 3 Exercises in Diffraction Contrast.- Appendix 4 Stereographic Projection Description for X-Ray Topography: Subgrain Boundaries and Stereo-Pairs.- Appendix 5 Dispersion Surface Exercises.- Appendix 6 Contrast of Stacking Faults.- Appendix 7 Misfit Boundaries and Junctions of Purely Rotational Boundaries.- Sponsors, Organising Committee, Advisory Panel.- Chemical Formula Index.


Best Sellers


Product Details
  • ISBN-13: 9781475711288
  • Publisher: Springer-Verlag New York Inc.
  • Publisher Imprint: Springer-Verlag New York Inc.
  • Height: 254 mm
  • No of Pages: 589
  • Returnable: Y
  • Width: 178 mm
  • ISBN-10: 147571128X
  • Publisher Date: 16 Dec 2012
  • Binding: Paperback
  • Language: English
  • Returnable: Y
  • Series Title: 63 NATO Science Series B:


Similar Products

Add Photo
Add Photo

Customer Reviews

REVIEWS      0     
Click Here To Be The First to Review this Product
Characterization of Crystal Growth Defects by X-Ray Methods: (63 NATO Science Series B:)
Springer-Verlag New York Inc. -
Characterization of Crystal Growth Defects by X-Ray Methods: (63 NATO Science Series B:)
Writing guidlines
We want to publish your review, so please:
  • keep your review on the product. Review's that defame author's character will be rejected.
  • Keep your review focused on the product.
  • Avoid writing about customer service. contact us instead if you have issue requiring immediate attention.
  • Refrain from mentioning competitors or the specific price you paid for the product.
  • Do not include any personally identifiable information, such as full names.

Characterization of Crystal Growth Defects by X-Ray Methods: (63 NATO Science Series B:)

Required fields are marked with *

Review Title*
Review
    Add Photo Add up to 6 photos
    Would you recommend this product to a friend?
    Tag this Book Read more
    Does your review contain spoilers?
    What type of reader best describes you?
    I agree to the terms & conditions
    You may receive emails regarding this submission. Any emails will include the ability to opt-out of future communications.

    CUSTOMER RATINGS AND REVIEWS AND QUESTIONS AND ANSWERS TERMS OF USE

    These Terms of Use govern your conduct associated with the Customer Ratings and Reviews and/or Questions and Answers service offered by Bookswagon (the "CRR Service").


    By submitting any content to Bookswagon, you guarantee that:
    • You are the sole author and owner of the intellectual property rights in the content;
    • All "moral rights" that you may have in such content have been voluntarily waived by you;
    • All content that you post is accurate;
    • You are at least 13 years old;
    • Use of the content you supply does not violate these Terms of Use and will not cause injury to any person or entity.
    You further agree that you may not submit any content:
    • That is known by you to be false, inaccurate or misleading;
    • That infringes any third party's copyright, patent, trademark, trade secret or other proprietary rights or rights of publicity or privacy;
    • That violates any law, statute, ordinance or regulation (including, but not limited to, those governing, consumer protection, unfair competition, anti-discrimination or false advertising);
    • That is, or may reasonably be considered to be, defamatory, libelous, hateful, racially or religiously biased or offensive, unlawfully threatening or unlawfully harassing to any individual, partnership or corporation;
    • For which you were compensated or granted any consideration by any unapproved third party;
    • That includes any information that references other websites, addresses, email addresses, contact information or phone numbers;
    • That contains any computer viruses, worms or other potentially damaging computer programs or files.
    You agree to indemnify and hold Bookswagon (and its officers, directors, agents, subsidiaries, joint ventures, employees and third-party service providers, including but not limited to Bazaarvoice, Inc.), harmless from all claims, demands, and damages (actual and consequential) of every kind and nature, known and unknown including reasonable attorneys' fees, arising out of a breach of your representations and warranties set forth above, or your violation of any law or the rights of a third party.


    For any content that you submit, you grant Bookswagon a perpetual, irrevocable, royalty-free, transferable right and license to use, copy, modify, delete in its entirety, adapt, publish, translate, create derivative works from and/or sell, transfer, and/or distribute such content and/or incorporate such content into any form, medium or technology throughout the world without compensation to you. Additionally,  Bookswagon may transfer or share any personal information that you submit with its third-party service providers, including but not limited to Bazaarvoice, Inc. in accordance with  Privacy Policy


    All content that you submit may be used at Bookswagon's sole discretion. Bookswagon reserves the right to change, condense, withhold publication, remove or delete any content on Bookswagon's website that Bookswagon deems, in its sole discretion, to violate the content guidelines or any other provision of these Terms of Use.  Bookswagon does not guarantee that you will have any recourse through Bookswagon to edit or delete any content you have submitted. Ratings and written comments are generally posted within two to four business days. However, Bookswagon reserves the right to remove or to refuse to post any submission to the extent authorized by law. You acknowledge that you, not Bookswagon, are responsible for the contents of your submission. None of the content that you submit shall be subject to any obligation of confidence on the part of Bookswagon, its agents, subsidiaries, affiliates, partners or third party service providers (including but not limited to Bazaarvoice, Inc.)and their respective directors, officers and employees.

    Accept

    Fresh on the Shelf


    Inspired by your browsing history


    Your review has been submitted!

    You've already reviewed this product!