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1.
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612
By: S. Ogawa, G. S. Oehrlein, K. Maex, J. T. Wetzel, Y. -C. Joo
Publisher: Cambridge University Press
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AED168
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
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2.
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612
By: S. Ogawa, G. S. Oehrlein, K. Maex, J. T. Wetzel, Y. -C. Joo
Publisher: Materials Research Society
No Review Yet
AED97
Binding:
Hardback
Release:
05 Apr 2001
Language:
English
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