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Thomas N. Marieb

Thomas N. Marieb

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Materials Reliability in Microelectronics VIII: Volume 516
Materials Reliability in Microelectronics VIII: Volume 516
By: James R. Lloyd, John C. Bravman, Thomas N. Marieb, Matt A. Korhonen
Publisher: Materials Research Society
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AED120
Binding:
Hardback
Release:
11 Nov 1998
Language:
English
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