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Thomas D Jarzen

Thomas D Jarzen

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Capacitance-Voltage Study on the Effects of Low Energy Electron Radiation on Al0.27Ga0.73N/Gan High Electron Mobility Transistor
Capacitance-Voltage Study on the Effects of Low Energy Electron Radiation on Al0.27Ga0.73N/Gan High Electron Mobility Transistor
By: Thomas D Jarzen
Publisher: BiblioBazaar, LLC
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AED57
Binding:
Paperback
Release:
05 Dec 2012
Language:
English
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