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Sandeep K. Goel

Sandeep K. Goel

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1.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Krishnendu Chakrabarty
Publisher: Taylor & Francis Ltd
No Review Yet
AED313
Binding:
Paperback
Release:
29 Mar 2017
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Krishnendu Chakrabarty
Publisher: Taylor & Francis Inc
No Review Yet
AED650
Binding:
Hardback
Release:
25 Oct 2013
Language:
English
Available
Ships within 2-4 Days Explain..
3.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Krishnendu Chakrabarty
Publisher: Taylor & Francis Ltd
No Review Yet
AED394
Binding:
Digital (delivered electronically)
Release:
19 Dec 2017
Language:
English
Out of Stock
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4.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Sandeep K. Goel, Krishnendu Chakrabarty
Publisher: Taylor & Francis Inc
No Review Yet
AED502
Binding:
Digital (delivered electronically)
Release:
19 Dec 2017
Language:
English
Out of Stock
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5.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
By: Krishnendu Chakrabarty , Sandeep K Goel (TSMC Technology Inc., San Jose, CA, USA TSMC Technology Inc., San Jose, California, USA TSMC Technology Inc., San Jose, California, USA TSMC Technology Inc., San Jose, California, USA TSMC Technology Inc., San Jose, California, USA)
Publisher: CRC Press
No Review Yet
AED644
Binding:
Graphic Novel
Release:
01 Jan 2013
Out of Stock
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