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1.
The Certification of a Reference Material for the Determination of Oxygen in Semiconductor Silicon by Infra-Red Spectrometry
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2.
Certification of the Contents (Mass Fractions) of Impurities (Al, CD, Cu, Fe, In, PB) 12817
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3.
The Certification of the Contents (Mass Fraction) of Cr, Fe, Hf and Sn in Zircaloy-4
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4.
The Certification of the Mass Fraction of Sulphur and Phosphorus in Copper
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The Certification of Benzene, Toluene and m-Xylene Sorbed on Tenax in Tubes
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The Certification of Impurities (AG, as, Bi, CD, Co, Cr, Fe, Mn, Ni, Pb, Sb, SE, Sn, TE and Zn) in Copper
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7.
The Certification of the Contents of Alloying Elements in Tia16v4 (Crm 089) and of Added Impurities (A1, B, Co, Cr, Cu, Fe, Mn, Mo, NB, Ni, Sn, V, W, Zr) in Titanium (Crm 090)
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8.
The Certification of Oxygen in Copper Crm No. 054r
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