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R D Schrimpf

R D Schrimpf

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Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Selected Topics in Electronics and Systems, Volume 34.
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Selected Topics in Electronics and Systems, Volume 34.
By: D M Fleetwood, R D Schrimpf
Publisher: World Scientific Publishing Company
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AED190
Binding:
Digital (delivered electronically)
Release:
01 Jan 2004
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