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Philippe Pougnet

Philippe Pougnet

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1.
Nanometer-scale Defect Detection Using Polarized Light
Nanometer-scale Defect Detection Using Polarized Light
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: ISTE Ltd and John Wiley & Sons Inc
No Review Yet
AED581
Binding:
Hardback
Release:
12 Aug 2016
Language:
English
International Edition
Ships within 18-20 Days Explain..
2.
Applications et métrologie à l'échelle nanométrique 2
Applications et métrologie à l'échelle nanométrique 2
By: Pierre Richard Dahoo, Philippe Pougnet
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED449
Binding:
Paperback
Release:
01 Dec 2021
Language:
French
International Edition
Ships within 10-12 Days Explain..
3.
Applications et métrologie à l'échelle nanométrique 1
Applications et métrologie à l'échelle nanométrique 1
By: Pierre Richard Dahoo, Philippe Pougnet
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED449
Binding:
Paperback
Release:
01 Dec 2021
Language:
French
International Edition
Ships within 10-12 Days Explain..
4.
Applications and Metrology at Nanometer Scale 1
Applications and Metrology at Nanometer Scale 1
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: ISTE Ltd and John Wiley & Sons Inc
No Review Yet
AED405
Binding:
Hardback
Release:
12 Feb 2021
Language:
English
Available
Ships within 12-14 Days Explain..
5.
Applications and Metrology at Nanometer-Scale 2
Applications and Metrology at Nanometer-Scale 2
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: ISTE Ltd and John Wiley & Sons Inc
No Review Yet
AED405
Binding:
Hardback
Release:
07 May 2021
Language:
English
Available
Ships within 12-14 Days Explain..
6.
Les systèmes mécatroniques embarqués 1
Les systèmes mécatroniques embarqués 1
By: Abdelkhalak El Hami, Philippe Pougnet
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED423
Binding:
Book
Release:
31 Jan 2020
Language:
French
International Edition
Ships within 10-12 Days Explain..
7.
Les systèmes mécatroniques embarqués 2
Les systèmes mécatroniques embarqués 2
By: Abdelkhalak El Hami, Philippe Pougnet
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED432
Binding:
Book
Release:
31 Jan 2020
Language:
French
International Edition
Ships within 10-12 Days Explain..
8.
Embedded Mechatronic Systems, Volume 1
Embedded Mechatronic Systems, Volume 1
By: Abdelkhalak El Hami, Philippe Pougnet
Publisher: ISTE Press Ltd - Elsevier Inc
No Review Yet
AED344
Binding:
Hardback
Release:
16 Jul 2015
Language:
English
Available
Ships within 2-4 Days Explain..
9.
Embedded Mechatronic Systems, Volume 2
Embedded Mechatronic Systems, Volume 2
By: Abdelkhalak El Hami, Philippe Pougnet
Publisher: ISTE Press Ltd - Elsevier Inc
No Review Yet
AED344
Binding:
Hardback
Release:
16 Jul 2015
Language:
English
Available
Ships within 2-4 Days Explain..
10.
Applications and Metrology at Nanometer-Scale 2
Applications and Metrology at Nanometer-Scale 2
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: John Wiley & Sons Inc
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
05 Mar 2021
Language:
English
Out of Stock
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11.
Applications and Metrology at Nanometer Scale 1
Applications and Metrology at Nanometer Scale 1
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: John Wiley & Sons Inc
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
07 Jan 2021
Language:
English
Out of Stock
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12.
Applications and Metrology at Nanometer-Scale 2
Applications and Metrology at Nanometer-Scale 2
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: John Wiley & Sons Inc
No Review Yet
AED84
Binding:
Digital (delivered electronically)
Release:
14 Apr 2021
Language:
English
Out of Stock
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13.
Applications and Metrology at Nanometer Scale 1
Applications and Metrology at Nanometer Scale 1
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: John Wiley & Sons Inc
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
14 Jan 2021
Language:
English
Out of Stock
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14.
Nanometer-scale Defect Detection Using Polarized Light
Nanometer-scale Defect Detection Using Polarized Light
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: John Wiley & Sons Inc
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
16 Aug 2016
Language:
English
Out of Stock
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15.
Nanometer-scale Defect Detection Using Polarized Light
Nanometer-scale Defect Detection Using Polarized Light
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: John Wiley & Sons Inc
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
16 Aug 2016
Language:
English
Out of Stock
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16.
Défauts à l'échelle nanométrique en lumière polarisée
Défauts à l'échelle nanométrique en lumière polarisée
By: Pierre Richard Dahoo, Philippe Pougnet
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED178
Binding:
Book
Release:
31 Jul 2016
Language:
French
Out of Stock
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