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Nathan James Speer

Nathan James Speer

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Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
By: Nathan James Speer
Publisher: Proquest, Umi Dissertation Publishing
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AED303
Binding:
Paperback
Release:
01 Sep 2011
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