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1.
Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
By: Josef Sikula, M. E Levinshtei?n
Publisher: Kluwer Academic Publishers
No Review Yet
AED573
Binding:
Digital (delivered electronically)
Release:
01 Jan 2005
Language:
English
Out of Stock
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2.
Sic Materials and Devices
Sic Materials and Devices
By: Michael S. Shur, M. E Levinshtei?n, Sergey L Rumyantsev
Publisher: World Scientific Publishing Co Pte Ltd
No Review Yet
AED352
Binding:
Digital (delivered electronically)
Release:
/12/2006
Language:
English
Out of Stock
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3.
Sic Materials and Devices
Sic Materials and Devices
By: Michael S. Shur, M. E Levinshtei?n, Sergey L Rumyantsev
Publisher: World Scientific Publishing Co Pte Ltd
No Review Yet
AED352
Binding:
Digital (delivered electronically)
Release:
/12/2007
Language:
English
Out of Stock
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4.
Breakdown Phenomena in Semiconductors and Semiconductor Devices
Breakdown Phenomena in Semiconductors and Semiconductor Devices
By: Juha Kostamovaara, Sergey Vainshtein, M. E Levinshtei?n
Publisher: World Scientific Publishing Co Pte Ltd
No Review Yet
AED533
Binding:
Digital (delivered electronically)
Release:
/12/2005
Language:
English
Out of Stock
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