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James R. Ehrstein

James R. Ehrstein

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1.
The Certification of 100 MM Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-Configuration, Four-Point Probe Measurements, 1999 Edition (Classic Reprint)
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2.
Preparation and Certification of Srm's for Calibration of Spreading Resistance Probes (Classic Reprint)
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3.
The Certification of 100 MM Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-Configuration, Four-Point Probe Measurements, 1999 Edition (Classic Reprint)
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4.
Preparation and Certification of Srm's for Calibration of Spreading Resistance Probes (Classic Reprint)
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5.
Certification of 100 MM Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-Configuration Four-Point Probe Measurements
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