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J Giber

J Giber

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1.
Secondary Ion Mass Spectrometry SIMS III
Secondary Ion Mass Spectrometry SIMS III
By: J. Giber, A. Benninghoven, M. Riedel, H.W. Werner, J. Laszlo
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED346
Binding:
Paperback
Release:
26 Jul 2012
Language:
English
Available
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2.
Defect Complexes in Semiconductor Structures
Defect Complexes in Semiconductor Structures
By: J. Giber, F. Beleznay, I. C. Szep, J. Laszlo
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED506
Binding:
Paperback
Release:
01 Feb 1983
Language:
English
Available
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3.
New Developments in Semiconductor Physics
New Developments in Semiconductor Physics
By: J. Giber, F. Beleznay, G. Ferenczi
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED253
Binding:
Paperback
Release:
01 May 1980
Language:
English
Available
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4.
Secondary Ion Mass Spectrometry Sims III
Secondary Ion Mass Spectrometry Sims III
By: J Giber, J Laszlo, A Benninghoven (Univ. of Munster)
Publisher: Springer
No Review Yet
AED29
Binding:
Paperback
Release:
01 Sep 2014
Out of Stock
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5.
Defect Complexes in Semiconductor Structures
Defect Complexes in Semiconductor Structures
By: J Giber
Publisher: Springer
No Review Yet
AED75
Binding:
Hardback
Release:
01 Mar 1983
Language:
English
Out of Stock
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6.
Secondary Ion Mass Spectrometry Sims III
Secondary Ion Mass Spectrometry Sims III
By: J. Giber, A. Benninghoven, M. Riedel, H. W. Werner, Janos Laszlo
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED230
Binding:
Hardback
Release:
01 Feb 1982
Language:
English
Out of Stock
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7.
Defect Complexes in Semiconductor Structures
Defect Complexes in Semiconductor Structures
By: I C Szep, F Beleznay, J Giber
Publisher: Springer
No Review Yet
AED105
Binding:
Paperback
Release:
15 Jan 2014
Out of Stock
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