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I. Cev Noyan

I. Cev Noyan

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1.
Advances in x-Ray Analysis
Advances in x-Ray Analysis
By: C.C. Goldsmith, I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, USA), John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, USA), Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA), Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA)
Publisher: Kluwer Academic Publishers Group
No Review Yet
AED267
Binding:
Hardback
Release:
30 Sep 1994
Language:
English
Available
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2.
Advances in X-Ray Analysis
Advances in X-Ray Analysis
By: John V. Gilfrich, Ting C. Huang, Ron Jenkins, I. Cev Noyan, C.C. Goldsmith
Publisher: Springer-Verlag New York Inc.
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AED289
Binding:
Paperback
Release:
05 Nov 2012
Language:
English
International Edition
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3.
Advances in X-Ray Analysis
Advances in X-Ray Analysis
By: Ron Jenkins, John V Gilfrich, I Cev Noyan
Publisher: Springer My Copy UK
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AED88
Binding:
Paperback
Release:
31 Jan 1998
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