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H. Rusty Harris

H. Rusty Harris

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1.
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155
By: H. Rusty Harris, Alexander A. Demkov, Jeffery W. Butterbaugh, Bill Taylor, Willy Rachmady
Publisher: Cambridge University Press
No Review Yet
AED158
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155
CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155
By: H. Rusty Harris, Alexander A. Demkov, Jeffery W. Butterbaugh, Bill Taylor, Willy Rachmady
Publisher: Materials Research Society
No Review Yet
AED500
Binding:
Hardback
Release:
19 Nov 2009
Language:
English
International Edition
Ships within 10-12 Days Explain..
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