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F P M Beenker

F P M Beenker

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1.
Testability Concepts for Digital ICs
Testability Concepts for Digital ICs
By: A.P. Thijssen, F.P.M. Beenker, R.G. Bennetts
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED718
Binding:
Paperback
Release:
04 Oct 2012
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
Testability Concepts for Digital ICs
Testability Concepts for Digital ICs
By: A.P. Thijssen, F.P.M. Beenker, R.G. Bennetts
Publisher: Kluwer Academic Publishers
No Review Yet
AED724
Binding:
Hardback
Release:
30 Nov 1995
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Testability Concepts for Digital ICS
Testability Concepts for Digital ICS
By: F P M Beenker, A P Thijssen, R G Bennetts
Publisher: Springer My Copy UK
No Review Yet
AED105
Binding:
Paperback
Release:
01 Nov 1995
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