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Eun Young Mun

Eun Young Mun

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1.
Advances in Configural Frequency Analysis
Advances in Configural Frequency Analysis
By: Eun-Young Mun, Alexander Von Eye, Patrick Mair
Publisher: Guilford Publications
No Review Yet
AED239
Binding:
Hardback
Release:
09 Jun 2010
Language:
English
Available
Ships within 2-4 Days Explain..
2.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Inc
No Review Yet
AED493
Binding:
Hardback
Release:
15 Jul 2004
Language:
English
Available
Ships within 10-12 Days Explain..
3.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Inc
No Review Yet
AED291
Binding:
Paperback
Release:
07 Sep 2006
Language:
English
International Edition
Ships within 22-24 Days Explain..
4.
Log-Linear Modeling
Log-Linear Modeling
By: Eun-Young Mun, Alexander Von Eye
Publisher: John Wiley & Sons Inc
No Review Yet
AED612
Binding:
Digital (delivered electronically)
Release:
21 Aug 2014
Language:
English
Out of Stock
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5.
Log-Linear Modeling
Log-Linear Modeling
By: Eun-Young Mun, Alexander Von Eye
Publisher: John Wiley & Sons Inc
No Review Yet
AED612
Binding:
Digital (delivered electronically)
Release:
14 Jan 2013
Language:
English
Out of Stock
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6.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED181
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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7.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED217
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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8.
Log–Linear Modeling
Log–Linear Modeling
By: Alexander Von Eye, Eun–Young Mun
Publisher: John Wiley & Sons Inc
No Review Yet
AED510
Binding:
Hardback
Release:
17 Dec 2012
Language:
English
Out of Stock
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9.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED217
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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10.
Log–Linear Modeling
Log–Linear Modeling
By: Alexander Von Eye, Eun–Young Mun
Publisher: John Wiley & Sons Inc
No Review Yet
AED57
Binding:
Other digital
Release:
14 Jan 2013
Language:
English
Out of Stock
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11.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED201
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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12.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Lawrence Erlbaum Associates Inc
No Review Yet
AED128
Binding:
Digital (delivered electronically)
Release:
27 Oct 2004
Language:
English
Out of Stock
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13.
Log-Linear Modeling
Log-Linear Modeling
By: Dr Alexander Von Eye (Michigan State University, USA Michigan State University, USA. Michigan State University, USA. Michigan State University, Michigan State University, Michigan State University, USA Michigan State University, USA Michigan State Univers, Eun-Young Mun (

Rutgers Univ., USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA)

Publisher: Wiley
No Review Yet
AED490
Binding:
Digital (delivered electronically)
Release:
01 Jan 2013
Out of Stock
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14.
Advances in Configural Frequency Analysis
Advances in Configural Frequency Analysis
By: Patrick Mair, Dr Alexander Von Eye (Michigan State University, USA Michigan State University, USA. Michigan State University, USA. Michigan State University, Michigan State University, Michigan State University, USA Michigan State University, USA Michigan State Univers, Eun-Young Mun (

Rutgers Univ., USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA)

Publisher: Guilford Publications
No Review Yet
AED268
Binding:
Digital (delivered electronically)
Release:
20 Apr 2010
Language:
English
Out of Stock
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15.
Advances in Configural Frequency Analysis
Advances in Configural Frequency Analysis
By: Patrick Mair, Dr Alexander Von Eye (Michigan State University, USA Michigan State University, USA. Michigan State University, USA. Michigan State University, Michigan State University, Michigan State University, USA Michigan State University, USA Michigan State Univers, Eun-Young Mun (

Rutgers Univ., USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA)

Publisher: Guilford Publications
No Review Yet
AED490
Binding:
Digital (delivered electronically)
Release:
01 Jan 2010
Out of Stock
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