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Eun Young Mun

Eun Young Mun

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1.
Advances in Configural Frequency Analysis
Advances in Configural Frequency Analysis
By: Eun-Young Mun, Alexander Von Eye, Patrick Mair
Publisher: Guilford Publications
No Review Yet
AED231
Binding:
Hardback
Release:
09 Jun 2010
Language:
English
Available
Ships within 8-10 Days Explain..
2.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Inc
No Review Yet
AED741
Binding:
Hardback
Release:
15 Jul 2004
Language:
English
Available
Ships within 10-12 Days Explain..
3.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Inc
No Review Yet
AED263
Binding:
Paperback
Release:
07 Sep 2006
Language:
English
International Edition
Ships within 14-16 Days Explain..
4.
Advances in Configural Frequency Analysis
Advances in Configural Frequency Analysis
By: Patrick Mair, Dr Alexander Von Eye (Michigan State University, USA Michigan State University, USA. Michigan State University, USA. Michigan State University, Michigan State University, Michigan State University, USA Michigan State University, USA Michigan State Univers, Eun-Young Mun (

Rutgers Univ., USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA)

Publisher: Guilford Publications
No Review Yet
AED0
Binding:
Digital (delivered electronically)
Release:
11 May 2010
Out of Stock
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5.
Log-Linear Modeling
Log-Linear Modeling
By: Eun-Young Mun, Alexander Von Eye
Publisher: John Wiley & Sons Inc
4.6 (7)
AED514
Binding:
Digital (delivered electronically)
Release:
14 Jan 2013
Language:
English
Out of Stock
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6.
Log-Linear Modeling
Log-Linear Modeling
By: Eun-Young Mun, Alexander Von Eye
Publisher: John Wiley & Sons Inc
No Review Yet
AED514
Binding:
Digital (delivered electronically)
Release:
21 Aug 2014
Language:
English
Out of Stock
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7.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED169
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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8.
Log–Linear Modeling
Log–Linear Modeling
By: Alexander Von Eye, Eun–Young Mun
Publisher: John Wiley & Sons Inc
No Review Yet
AED428
Binding:
Hardback
Release:
17 Dec 2012
Language:
English
Out of Stock
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9.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED152
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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10.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Lawrence Erlbaum Associates Inc
No Review Yet
AED108
Binding:
Digital (delivered electronically)
Release:
27 Oct 2004
Language:
English
Out of Stock
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11.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED182
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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12.
Analyzing Rater Agreement
Analyzing Rater Agreement
By: Alexander Von Eye, Eun Young Mun
Publisher: Taylor & Francis Ltd
No Review Yet
AED182
Binding:
Digital (delivered electronically)
Release:
04 Apr 2014
Language:
English
Out of Stock
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13.
Log–Linear Modeling
Log–Linear Modeling
By: Alexander Von Eye, Eun–Young Mun
Publisher: John Wiley & Sons Inc
No Review Yet
AED48
Binding:
Other digital
Release:
14 Jan 2013
Language:
English
Out of Stock
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14.
Log-Linear Modeling
Log-Linear Modeling
By: Dr Alexander Von Eye (Michigan State University, USA Michigan State University, USA. Michigan State University, USA. Michigan State University, Michigan State University, Michigan State University, USA Michigan State University, USA Michigan State Univers, Eun-Young Mun (

Rutgers Univ., USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA)

Publisher: Wiley
No Review Yet
AED412
Binding:
Digital (delivered electronically)
Release:
01 Jan 2013
Out of Stock
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15.
Advances in Configural Frequency Analysis
Advances in Configural Frequency Analysis
By: Patrick Mair, Dr Alexander Von Eye (Michigan State University, USA Michigan State University, USA. Michigan State University, USA. Michigan State University, Michigan State University, Michigan State University, USA Michigan State University, USA Michigan State Univers, Eun-Young Mun (

Rutgers Univ., USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA)

Publisher: Guilford Publications
No Review Yet
AED225
Binding:
Digital (delivered electronically)
Release:
20 Apr 2010
Language:
English
Out of Stock
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16.
Advances in Configural Frequency Analysis
Advances in Configural Frequency Analysis
By: Patrick Mair, Dr Alexander Von Eye (Michigan State University, USA Michigan State University, USA. Michigan State University, USA. Michigan State University, Michigan State University, Michigan State University, USA Michigan State University, USA Michigan State Univers, Eun-Young Mun (

Rutgers Univ., USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA Rutgers University, USA)

Publisher: Guilford Publications
No Review Yet
AED412
Binding:
Digital (delivered electronically)
Release:
01 Jan 2010
Out of Stock
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