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Dimitris Gizopoulos

Dimitris Gizopoulos

Dimitris Gizopoulos is a professor in the Department of Informatics & Telecommunications at the National and Kapodistrian University of Athens, Greece, where he leads the Computer Architecture Laboratory. His research focuses on the dependability,performance and energy efficiency of computing systems architectures built around general purpose microprocessors and specialized accelerators. He is a Fellow of IEEE and a Senior Member of ACM.

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1.
Advanced Parallel Processing Technologies
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AED388
Binding:
Paperback
Release:
04 Nov 2025
Language:
English
International Edition
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2.
Cross-Layer Reliability of Computing Systems
International Edition
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3.
Dependable Multicore Architectures at Nanoscale
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AED506
Binding:
Paperback
Release:
30 Aug 2018
Language:
English
Available
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4.
Dependable Multicore Architectures at Nanoscale
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AED244
Binding:
Hardback
Release:
06 Dec 2017
Language:
English
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5.
Advances in Electronic Testing
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AED410
Binding:
Hardback
Release:
23 Jan 2006
Language:
English
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6.
Advances in Electronic Testing
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AED759
Binding:
Paperback
Release:
05 Dec 2014
Language:
English
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7.
Embedded Processor-Based Self-Test
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AED746
Binding:
Hardback
Release:
20 Dec 2004
Language:
English
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8.
Embedded Processor-Based Self-Test
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AED759
Binding:
Paperback
Release:
14 Dec 2011
Language:
English
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9.
Advances in Electronic Testing
Publisher: Springer
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AED364
Binding:
Hardback
Release:
30 Aug 2008
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10.
Advances in Electronic Testing
Publisher: Springer
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AED108
Binding:
Digital (delivered electronically)
Release:
01 Jan 2006
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11.
Cross-Layer Reliability of Computing Systems
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AED637
Binding:
Digital download and online
Release:
01 Oct 2020
Language:
English
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12.
Embedded Processor-Based Self-Test
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AED61
Binding:
Paperback
Release:
20 Dec 2004
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13.
Embedded Processor-Based Self-Test
Publisher: Springer London
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AED527
Binding:
Digital (delivered electronically)
Release:
01 Dec 2005
Language:
English
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14.
Advances in Electronic Testing
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AED123
Binding:
Digital (delivered electronically)
Release:
/12/2006
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15.
Advances in Electronic Testing: Challenges and Methodologies
Publisher: Springer Us
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AED175
Binding:
Undefined
Release:
01 Jan 2006
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