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Daniel M. Fleetwood

Daniel M. Fleetwood

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1.
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
By: Daniel M Fleetwood, Ronald D Schrimpf
Publisher: World Scientific Publishing Co Pte Ltd
No Review Yet
AED697
Binding:
Hardback
Release:
03 Aug 2004
Language:
English
International Edition
Ships within 16-18 Days Explain..
2.
Defects in Microelectronic Materials and Devices
Defects in Microelectronic Materials and Devices
By: Ronald D. Schrimpf, Daniel M. Fleetwood
Publisher: Taylor & Francis Ltd
No Review Yet
AED289
Binding:
Paperback
Release:
07 Oct 2019
Language:
English
Available
Ships within 14-16 Days Explain..
3.
Defects in Microelectronic Materials and Devices
Defects in Microelectronic Materials and Devices
By: Ronald D. Schrimpf, Daniel M. Fleetwood
Publisher: Taylor & Francis Ltd
No Review Yet
AED172
Binding:
Digital (delivered electronically)
Release:
19 Nov 2008
Language:
English
Out of Stock
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4.
Defects in Microelectronic Materials and Devices
Defects in Microelectronic Materials and Devices
By: Ronald D. Schrimpf, Daniel M. Fleetwood
Publisher: Taylor & Francis Inc
No Review Yet
AED745
Binding:
Hardback
Release:
19 Nov 2008
Language:
English
Out of Stock
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