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Ben Kaczer

Ben Kaczer

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1.
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
By: Jacopo Franco, Ben Kaczer, Guido Groeseneken
Publisher: Springer
No Review Yet
AED506
Binding:
Hardback
Release:
29 Oct 2013
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
By: Jacopo Franco, Ben Kaczer, Guido Groeseneken
Publisher: Springer
No Review Yet
AED506
Binding:
Paperback
Release:
23 Aug 2016
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications
Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications
By: Jacopo Franco, Ben Kaczer, Guido Groeseneken
Publisher: Springer
No Review Yet
AED105
Binding:
Paperback
Release:
30 Nov 2013
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