Buy books written by A. C. Diebold Available at Bookswagon

Pigments, Extenders, and Particles in Surface Coatings and Plastics

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AED1,004

Binding:	SA
Release:	14 Dec 1998
Language:	English

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2.

By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu

Publisher: Springer Nature Switzerland AG

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AED410

Binding:	Paperback
Release:	07 Nov 2023
Language:	English

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3.

Pigments, Extenders, and Particles in Surface Coatings and Plastics

By: Michael Diebold, Steven de Backer, Brett R. Hester, Frank A. C. Vanhecke, Philipp M. Niedenzu

Publisher: Springer Nature Switzerland AG

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AED559

Binding:	Hardback
Release:	06 Nov 2022
Language:	English

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4.

Publisher: Taylor & Francis Ltd

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AED374

Binding:	Paperback
Release:	17 Oct 2019
Language:	English

International Edition

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5.

Histopathology of Nodal and Extranodal Non-Hodgkin’s Lymphomas

Publisher: Taylor & Francis Inc

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AED2,747

Binding:	Hardback
Release:	29 Jun 2001
Language:	English

International Edition

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6.

By: Alfred C. Feller, Jacques Diebold, A. le Tourneau, M. Paulli

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

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AED383

Binding:	Hardback
Release:	20 Nov 2003
Language:	English

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7.

Fast Pyrolysis of Biomass

By: S. Czernik, J. Diebold, A. Oasmaa, C. Peacocke, A. V. Bridgwater

Publisher: Cpl Press

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AED252

Binding:	Hardback
Release:	14 Apr 2008
Language:	English

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8.

By: C Diebold Alain

Publisher: Taylor & Francis Group

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AED0

Binding:	Digital (delivered electronically)
Release:	29 Jun 2001

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9.

Publisher: Taylor & Francis Ltd

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AED267

Binding:	Digital (delivered electronically)
Release:	29 Jun 2001
Language:	English

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10.

Frontiers of Characterization and Metrology for Nanoelectronics

Publisher: Taylor & Francis Ltd

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AED267

Binding:	Digital (delivered electronically)
Release:	29 Jun 2001
Language:	English

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11.

By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Amal Chabli, Robert McDonald

Characterization and Metrology for ULSI Technology 2003

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AED548

Binding:	SA
Release:	26 Apr 2012
Language:	English

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12.

By: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Stefan Zollner, Rajinder P. Khosla

Frontiers of Characterization and Metrology for Nanoelectronics

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AED559

Binding:	Hardback
Release:	08 Oct 2003
Language:	English

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13.

By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald

Frontiers of Characterization and Metrology for Nanoelectronics

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AED542

Binding:	SA
Release:	01 Sep 2007
Language:	English

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14.

By: David G. Seiler, Alain C. Diebold, Erik M. Secula, Rajinder P. Khosla, Robert McDonald

Characterization and Metrology for ULSI Technology 2000

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AED288

Binding:	Hardback
Release:	26 Oct 2009
Language:	English

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15.

By: Patrick J. Smith, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis

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AED789

Binding:	SA
Release:	01 Mar 2001
Language:	English

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16.

By: A. C Diebold

Publisher: Taylor & Francis Inc

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AED734

Binding:	Digital (delivered electronically)
Release:	/12/2001

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17.

Irrigation Trials in the Southwest Region (Classic Reprint)

By: C Diebold Alain

Publisher: Taylor & Francis Group

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AED821

Binding:	Digital (delivered electronically)
Release:	01 Jan 2001

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18.

By: C H Diebold

Publisher: Forgotten Books

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AED91

Binding:	Hardback
Release:	09 Sep 2018
Language:	English

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19.

Publisher: Taylor & Francis Inc

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AED667

Binding:	Digital (delivered electronically)
Release:	29 Jun 2001
Language:	English

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20.