Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes)
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Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes): (2 Materials and Energy)

Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes): (2 Materials and Energy)


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About the Book

HighlightsFirst comprehensive handbook on instrumentation and techniques for semiconductor nanostructure characterizationMore than 900 references providing up-to-date information With over 260 illustrationsAs we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.

Table of Contents:
Atom Probe Tomography; Plasmon Dynamics of Nanostructured Surfaces; Scanning Tunneling Microscopy of Self Assembled III-V Nanostructures; Nanomembranes; Aberration Corrected Scanning Transmission Microscopy and Electron Energy Loss; Rayleigh Scattering from Carbon Nanotubes; Low Energy Electron Microscopy Studies of Nanostructured Semiconductor Surfaces; Scanning Probe Microscopy of GaN Based Structures; Time Domain Thermoreflectance for Thermal Characterization of Nanostructures; X-Ray Studies of Nanostructures; Single Nanowire Photoelectron Spectroscopy; Ultra-High Vacuum Transmission Electron Microscopy; Synthesis and Studies of Low-Dimensional Structures; Raman Spectroscopy of Carbon Nanotubes; Scanning Electron Microscopy for Characterization of Semiconducting Nanowires; X-Ray Diffraction for Stress Determination in Nanostructures.


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Product Details
  • ISBN-13: 9789814322805
  • Publisher: World Scientific Publishing Co Pte Ltd
  • Binding: Hardback
  • No of Pages: 680
  • ISBN-10: 9814322806
  • Publisher Date: 01 Dec 2011
  • Language: English
  • Series Title: 2 Materials and Energy


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Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes): (2 Materials and Energy)
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Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes): (2 Materials and Energy)
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