Diffraction and Spectroscopic Methods in Electrochemistry: (18 Advances in Electrochemical Sciences and Engineering)

This ninth volume in the series concentrates on in situ spectroscopic methods and combines a balanced mixture of theory and applications, making it highly readable for chemists and physicists, as well as for materials scientists and engineers. As with the previous volumes, all the chapters continue the high standards of this series, containing numerous references to further reading and the original literature, for easy access to this new field. The editors have succeeded in selecting highly topical areas of research and in presenting authors who are leaders in their fields, covering such diverse topics as diffraction studies of the electrode-solution interface, thin organic films at electrode surfaces, linear and non-linear spectroscopy as well as sum frequency generation studies of the electrified solid-solution interface, plus quantitative SNIFTIRS and PM-IRRAS. Special attention is paid to recent advances and developments, which are critically and thoroughly discussed. The result is a compelling set of reviews, serving equally well as an excellent and up-to-date source of information for experienced researchers in the field, as well as as an introduction for newcomers.

Table of Contents:
In Situ X-ray Diffraction Studies of the Electrode-solution Interface UV-visible Reflectance Spectroscopy of Thin Organic Films at Electrode Surfaces Epi-fluorescence Microscopy Studies of Potential Controlled Changes in Adsorbed Thin Films at Electrode Surfaces Linear and Non-linear Spectroscopy at the Electrified Liquid-liquid Interface Sum Frequency Generation Studies of the Electrified Solid-solution Interface IR Spectroscopy of the Semiconductor-solution Interface Recent Advances in the In Situ IR Spectroscopy Studies of Electroanalysis at Pt Electrode Surfaces In-situ Surface Enhanced IR Spectroscopy of the Electrode-solution Interface Quantitative SNIFTIRS and PM-IRRAS of Organic Molecules at Electrode Surfaces Tip-enhanced Raman Spectroscopy Recent Developments and Future Prospects

About the Author :
Richard C. Alkire, Department of Chemical Engineering, University of Illinois, Urbana, USA Dieter M. Kolb, Department of Electrochemistry, University of Ulm, Germany Jacek Lipkowski, Department of Chemistry, University of Guelph, Canada Philip N. Ross, Materials Science Department, Lawrence Berkeley National Laboratory, Berkeley, USA

Review :
"...highly recommended for all graduate and advanced undergraduate students...it would be of interest to a wide spectrum of professionals as well." (Journal of the American Chemical Society, December 26, 2007)