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X–Ray Physics for Free–Electron Laser Applications

X–Ray Physics for Free–Electron Laser Applications


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About the Book

Table of Contents:
INTRODUCTION Introduction to XFELs and Their History XFELs Applied to Different Scientific Disciplines Energy, Time, and Length Scales of XFEL-Matter Interaction RADIATIVE AND ATOMIC PROCESSES Atomic States Radiative Atomic Processes Nonradiative Atomic Processes Effect of Plasma Environment Quantum X-Ray Physics Available Databases ELECTRON DYNAMICS IN MATERIALS Electron Scattering Energy Loss Mechanisms in Materials Electron Dynamics in Plasmas Statistical Description of Electron Dynamics Charge Trapping in Small Objects DYNAMICS OF X-RAY-IRRADIATED MATERIALS Transition of Condensed Matter to A Plasma X-Ray-Matter Interaction Time Scales the Effect of X-Ray Heating on Absorption Thermal Phase Transformation Nonthermal Phase Transformation Ablation X-Ray-Induced Mechanical Damage Nonuniform Heating Simulation of the Dynamics of X-Ray?Irradiated Materials SCATTERING OF X-RAY RADIATION Scattering by Free Charges Scattering by Atoms and Ions Resonant X-Ray Scattering Scattering by Molecules, Gases, Liquids, and Amorphous Solids Scattering by Plasmas Scattering by Crystals ELECTROMAGNETIC WAVE PROPAGATION Coherence Properties Optical Properties of Materials and Kramers-Kronig Relation Electromagnetic Waves Propagation Dispersive Interaction of Wave Packets with Materials Reflection and Refraction at Interfaces Imaging Techniques X-RAY SOURCES Review of Conventional Laboratory X-Ray Sources Synchrotron Radiation Insertion Devices Synchrotrons and Energy-Recovery Linacs XFEL Compact XFEL Sources Current XFEL Facilities X-RAY OPTICS Compound Refractive Lenses Zone Plates Grazing Incidence Mirrors Reflective Thin Films and Multilayers Crystal Optics Single-Pulse X-Ray Optics X-RAY DIAGNOSTICS Pulse Energy Coherence Pulse Size Characterizing Short X-Ray Pulses EXAMPLES OF XFEL APPLICATIONS Photochemistry Biological Structure Determination X-Ray Scattering Diagnostics of Dense Plasmas

About the Author :
Stefan P. Hau-Riege is the Applied Physics Associate Division Leader at Lawrence Livermore National Laboratory (LLNL) where he works on XFEL interactions with materials, x-ray instrumentation, and ultrafast imaging, using both on computational and experimental physics. Previously he worked on extreme-ultraviolet lithography and laser-assisted recrystallization. Dr. Hau-Riege received his PhD in materials science from MIT in 2000, and a MS in solid-state physics and applied mathematics from the University of Hamburg, Germany. He has authored and co-authored more than 210 scientific publications and is co-inventor of more than 20 patents.


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Product Details
  • ISBN-13: 9783527413874
  • Publisher: Wiley-VCH Verlag GmbH
  • Publisher Imprint: Wiley-VCH Verlag GmbH
  • Height: 244 mm
  • No of Pages: 325
  • Returnable: N
  • ISBN-10: 3527413871
  • Publisher Date: 28 Jun 2023
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Width: 170 mm


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