Characterization of Surfaces and Nanostructures: Academic and Industrial Applications

This up-to-date review of the most important areas where surface analysis techniques are employed covers recent developments in traditional fields, as well as such newly emerged important subfields as biomaterials and metrology. The handbook is problem oriented, aiding readers in finding the technique optimally suited for any specific analytic problem. Following a section surveying the fields of application and introducing physical analysis methods, a second section on the fundamentals provides the necessary physical background, with summaries at the end of each chapter highlighting the most important features of any particular technique. The third section on applications outlines how problems in various fields can be tackled using these techniques, including: * semiconductors * metallurgy * magnetic materials * polymers * biomaterials * catalysis * oxidation * corrosion * adhesion * tribology * metrology * environmental analysis * aerospace technology * archeometry. Summaries at the end of these chapters state which feature of any technique is beneficial for the particular analytical problem in question. Essential reading for those working in quality control, production process development, failure analysis, dimensional and chemical metrology and the development and functionalization of new materials.

Table of Contents:
SECTION I INTRODUCTION Introduction: Survey of the Fields of Application, Introduction of Physical Analysis Methods SECTION II FUNDAMENTALS Electron Beam Techniques Fundamentals of the Electron-Solid Interaction Auger Electron Spectroscopy X-ray Photoelectron Spectroscopy Electron Probe Microanalysis Transmission Electron Microscopy Ion Beam Techniques Fundamentals of the Ion-Solid Interaction Rutherford Backscattering Spectrometry Elastic Recoil Detection Ion Scattering Spectroscopy Secondary Ion Mass Spectrometry Nuclear Techniques Scanning Probe Microscopy Scanning Tunneling Microscopy Atomic Force Microscopy Other Scanning Probe Microscopy Techniques SECTION III APPLICATIONS Sample Preparation Techniques Semiconductors Magnetic Materials Catalysis Metallurgy Tribology Oxidation Corrosion Polymers Adhesion Biomaterials Metrology Environmental Analysis Areospace Technology Archeometry Outlook

About the Author :
Masters degree in physics at the Rijksuniversiteit Utrecht in the Netherlands 1988. PhD in Technical Physics at the Technical University Vienna 1991, senior research engineer with Digital Equipment Corporation in Massachusetts, US. At present: Assistant Professor at the Institut für Allgemeine Physik, Vienna University of Technology. Over 100 papers published in scientific journals and edited books.