This book describes new principles, methods and techniques for parametric optimization of integrated circuits, considering the influence of secondary negative factors on the normal operation of circuit components, such as change of environmental conditions, parasitics, leakage currents, aging, etc. The efficiency of the methods discussed is demonstrated by examples of practical designs, enabling readers to use them in similar integrated circuit designs. The authors demonstrate newly developed principles and methods of transforming the given circuit and constraints into a single-objective or multi-objective optimization problem, applying swarm intelligence optimization algorithms and machine learning strategies, with the goal of finding the global minimum with the least number of simulations. The observed circuit types include but are not limited to analog, mixed-signal, high performance heterogeneous integrated circuits as well as digital cores.
Table of Contents:
Development of design means for automated parametric optimization of digital integrated circuits.- Development of means to design integrated circuits taking into account ageing phenomena.- Development of means to improve the operational parameters and reliability of power supply and control systems embedded in integrated memory devices.- Development of means for reliability improvement in high-speed serial data receivers.- Development of means to improve the efficiency of information transmission systems between integrated circuits.- Development of means to mitigate the crosstalk in integrated circuits using machine learning.
About the Author :
Vazgen Melikyan joined Synopsys in 2004 as Director of Educational Department and is the Head since its establishment. Vazgen holds BS from Yerevan Polytechnic Institute, Ph.D. from Moscow Engineering-Physics Institute, Sc.D. and full Professor from National Polytechnic University of Armenia, Corresponding Member of National Academy of Sciences of Armenia. Vazgen is a member of Program Committee or Head of sessions in various international scientific conferences, Head of Boards in defenses of dissertations. He is the author of 13 monographs, more than 350 scientific and 135 methodical publications, more than 150 courses, had more than 190 reports in international conferences. 90 PhD dissertations have been carried out and successfully defended under his supervision. In addition, he is the President of Program Committee of International Microelectronics Olympiad, Head of Armenia’s Presidential Award Committee in the sector of science and technology, Executive Secretary of Educational Awards of Armenia in IT sector. Vazgen has been conferred various awards and prizes, including the title of Honorable Scientist of the Republic of Armenia, “President of the Republic Prize” in “Technical Sciences and Information Technologies”, National Academy of Sciences of Armenia Award for the “Best Scientific Work”, “Best Paper” Awards in various international conferences, he is Honorable professor of several universities, including National Research University MIET and European Academy of Armenia.
Li Kang is an associate professor in the Faculty of Integrated Circuit at Xidian University, engaging in research on integrated circuit reliability and optimization. His work focuses on device aging failure modeling, circuit reliability design and Power, Performance, Area (PPA) optimization, and solves the problems of circuit reliability evaluation and performance and power optimization. He has proposed methods for circuit reliability evaluation as well as PPA prediction and optimization and has published more than 20 papers indexed by SCI and EI. He has participated in dozens of projects, funded by the Key R&D Program of the Ministry of Science and Technology of China and other sources.
