Buy ToF-SIMS: Materials Analysis by Mass Spectrometry by John C. Vickerman
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Book 1
Book 2
Book 3
Home > Mathematics and Science Textbooks > Chemistry > Analytical chemistry > Spectrum analysis, spectrochemistry, mass spectrometry > ToF-SIMS: Materials Analysis by Mass Spectrometry: (ToF-SIMS)
ToF-SIMS: Materials Analysis by Mass Spectrometry: (ToF-SIMS)

ToF-SIMS: Materials Analysis by Mass Spectrometry: (ToF-SIMS)


     0     
5
4
3
2
1



Out of Stock


Notify me when this book is in stock
X
About the Book

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging in two and three dimensions, and microanalysis. This is the Second Edition of the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to instrumentation and sample handling, fundamentals and molecular dynamics simulations, optimisation methods - including laser post-ionisation of sputtered neutrals, data interpretation and analytical applications. All the contributors are internationally recognised as leaders in their respective fields and come from both Europe, USA and Asia.

Table of Contents:
Contents Prologue: ToF-SIMS - An evolving mass spectrometry of materials (John C. Vickerman The history of Static SIMS - A personal perspective (Alfred Benninghoven) Status of cascad theory (Herbert M. Urbassek) Fundamentals of organic SIMS: insights from experiments and models (Arnaud Delcorte) Molecular speciation analysis of inorganic compounds (Luc van Vaeck) Molecular dynamics simulations, the theorectical partner to dynamic cluster SIMS experiments (Barbara J.Garrison and Zbigniew Postawa)) Cationisation (Birgit Hagenhoff) Laser post-ionisation - fundamentals (Andreas Wucher) Time-of-flight mass analysers (Bruno W. Schueler) Analysis beams used in toF-SIMS (Rowland Hill) Cluster and polyatomic primary ion beams (John S. fletcher and Christopher Szakal) Molecular depth profiling (Alex Shard, Ian Gilmore and Andreas Wucher) Role of operating conditions in ToF-SIMS (Ian Gilmore) Laser post-ionisation for elemental and molecular surface analysis (Nicholoas P. Lockyer) Sample handling for ToF-SIMS (Fraser Reich) Qualitative interpretation of spectra (David Briggs and Ian W. Fletcher) Multivariate analysis of SIMS spectra (Alex Henderson) ToF-SIMS image analysis (Bonnie J. Tyler) Characterisation of polymeric materials (Lutao Weng and Chiming Chan) li>Functional modification of surfaces using self-assembled monolayers (Amy Walker) Application of SIMS to study of biological systems (Alain M. Piwowar and Nicholas Winograd) Medical and biological applications of cluster ToF-SIMS (David Touboul, Oliver Laprevote and Alain Brunelle) Depth profiling of inorganic materials (Ewald Niehuis and Thomas Grehl) Depth profiling in organic electronics (Ewald Niehuis) Contamination monitoring and failure analysis (Arwa Ginwalla, Thomas, F. Fister and Ian A. Mowat) Photographic and digital graphic materials (Luc van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel de Mondt, Jaymes van Luppen and Frank Vangaever) Applications of ToF-SIMS in cosmochemistry (Thomas Stephan and Ian C. Lyon) Index


Best Sellers


Product Details
  • ISBN-13: 9781906715175
  • Publisher: IM Publications Open LLP
  • Publisher Imprint: IM Publications LLP
  • Height: 250 mm
  • Spine Width: 37 mm
  • Width: 175 mm
  • ISBN-10: 1906715173
  • Publisher Date: 31 Jul 2013
  • Binding: Hardback
  • Series Title: ToF-SIMS
  • Weight: 1900 gr


Similar Products

Add Photo
Add Photo

Customer Reviews

REVIEWS      0     
Click Here To Be The First to Review this Product
ToF-SIMS: Materials Analysis by Mass Spectrometry: (ToF-SIMS)
IM Publications Open LLP -
ToF-SIMS: Materials Analysis by Mass Spectrometry: (ToF-SIMS)
Writing guidlines
We want to publish your review, so please:
  • keep your review on the product. Review's that defame author's character will be rejected.
  • Keep your review focused on the product.
  • Avoid writing about customer service. contact us instead if you have issue requiring immediate attention.
  • Refrain from mentioning competitors or the specific price you paid for the product.
  • Do not include any personally identifiable information, such as full names.

ToF-SIMS: Materials Analysis by Mass Spectrometry: (ToF-SIMS)

Required fields are marked with *

Review Title*
Review
    Add Photo Add up to 6 photos
    Would you recommend this product to a friend?
    Tag this Book Read more
    Does your review contain spoilers?
    What type of reader best describes you?
    I agree to the terms & conditions
    You may receive emails regarding this submission. Any emails will include the ability to opt-out of future communications.

    CUSTOMER RATINGS AND REVIEWS AND QUESTIONS AND ANSWERS TERMS OF USE

    These Terms of Use govern your conduct associated with the Customer Ratings and Reviews and/or Questions and Answers service offered by Bookswagon (the "CRR Service").


    By submitting any content to Bookswagon, you guarantee that:
    • You are the sole author and owner of the intellectual property rights in the content;
    • All "moral rights" that you may have in such content have been voluntarily waived by you;
    • All content that you post is accurate;
    • You are at least 13 years old;
    • Use of the content you supply does not violate these Terms of Use and will not cause injury to any person or entity.
    You further agree that you may not submit any content:
    • That is known by you to be false, inaccurate or misleading;
    • That infringes any third party's copyright, patent, trademark, trade secret or other proprietary rights or rights of publicity or privacy;
    • That violates any law, statute, ordinance or regulation (including, but not limited to, those governing, consumer protection, unfair competition, anti-discrimination or false advertising);
    • That is, or may reasonably be considered to be, defamatory, libelous, hateful, racially or religiously biased or offensive, unlawfully threatening or unlawfully harassing to any individual, partnership or corporation;
    • For which you were compensated or granted any consideration by any unapproved third party;
    • That includes any information that references other websites, addresses, email addresses, contact information or phone numbers;
    • That contains any computer viruses, worms or other potentially damaging computer programs or files.
    You agree to indemnify and hold Bookswagon (and its officers, directors, agents, subsidiaries, joint ventures, employees and third-party service providers, including but not limited to Bazaarvoice, Inc.), harmless from all claims, demands, and damages (actual and consequential) of every kind and nature, known and unknown including reasonable attorneys' fees, arising out of a breach of your representations and warranties set forth above, or your violation of any law or the rights of a third party.


    For any content that you submit, you grant Bookswagon a perpetual, irrevocable, royalty-free, transferable right and license to use, copy, modify, delete in its entirety, adapt, publish, translate, create derivative works from and/or sell, transfer, and/or distribute such content and/or incorporate such content into any form, medium or technology throughout the world without compensation to you. Additionally,  Bookswagon may transfer or share any personal information that you submit with its third-party service providers, including but not limited to Bazaarvoice, Inc. in accordance with  Privacy Policy


    All content that you submit may be used at Bookswagon's sole discretion. Bookswagon reserves the right to change, condense, withhold publication, remove or delete any content on Bookswagon's website that Bookswagon deems, in its sole discretion, to violate the content guidelines or any other provision of these Terms of Use.  Bookswagon does not guarantee that you will have any recourse through Bookswagon to edit or delete any content you have submitted. Ratings and written comments are generally posted within two to four business days. However, Bookswagon reserves the right to remove or to refuse to post any submission to the extent authorized by law. You acknowledge that you, not Bookswagon, are responsible for the contents of your submission. None of the content that you submit shall be subject to any obligation of confidence on the part of Bookswagon, its agents, subsidiaries, affiliates, partners or third party service providers (including but not limited to Bazaarvoice, Inc.)and their respective directors, officers and employees.

    Accept


    Inspired by your browsing history


    Your review has been submitted!

    You've already reviewed this product!