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Home > Reference Books > Research and information: general > Research methods: general > Ceramic Strain Gages for Use at Temperatures Up to 1500 Celsius
Ceramic Strain Gages for Use at Temperatures Up to 1500 Celsius

Ceramic Strain Gages for Use at Temperatures Up to 1500 Celsius


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About the Book

Indium-tin-oxide (ITO) thin film strain gages were successfully demonstrated at temperatures beyond 1500 C. High temperature static strain tests revealed that the piezoresistive response and electrical stability of the ceramic sensors depended on the thickness of the ITO films comprising the active strain elements. When 2.5 microns-thick ITO films were employed as the active strain elements, the piezoresistive response became unstable at temperatures above 1225 C. In contrast to this, ceramic sensors prepared with 5 microns-thick ITO were stable beyond 1430 C and sensors prepared with 8 microns-thick ITO survived more than 20 hr of operation at 1481 C. Very thick (10 microns) ITo strain gages were extremely stable and responsive at 1528 C. ESCA depth profiles confirmed that an interfacial reaction between the ITO strain gage and alumina substrate was responsible for the high temperature electrical stability observed. Similar improvements in high temperature stability were achieved by doping the active ITO strain elements with aluminum. Several Sic-Sic CMC constant strain beams were instrumented with ITO strain gages and delivered to NASA for testing. Due to the extreme surface roughness of the CMC substrates, new lithography techniques and surface preparation methods were developed. These techniques relied heavily on a combination of Sic and A12O3 cement layers to provide the necessary surface finish for efficient pattern transfer. Micro-contact printing using soft lithography and PDMS stamps was also used to successfully transfer the thin film strain gage patterns to the resist coated CMC substrates. This latter approach has considerable potential for transferring the thin film strain gage patterns to the extremely rough surfaces associated with the CMC's.Gregory, Otto and Fralick, Gustave (Technical Monitor)Glenn Research CenterHIGH TEMPERATURE; STRAIN GAGES; THIN FILMS; ITO (SEMICONDUCTORS); THERMAL STABILITY; SURFACE ROUGHNESS; SURFACE FINISHING; HIGH TEMPERATUR


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Product Details
  • ISBN-13: 9781720413851
  • Publisher: Createspace Independent Publishing Platform
  • Publisher Imprint: Createspace Independent Publishing Platform
  • Height: 279 mm
  • No of Pages: 30
  • Spine Width: 2 mm
  • Width: 216 mm
  • ISBN-10: 1720413851
  • Publisher Date: 29 May 2018
  • Binding: Paperback
  • Language: English
  • Returnable: N
  • Weight: 95 gr


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