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Home > Science, Technology & Agriculture > Electronics and communications engineering > Electronics engineering > Electronic devices and materials > MOSFETs: Properties, Preparations & Performance
MOSFETs: Properties, Preparations & Performance

MOSFETs: Properties, Preparations & Performance


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About the Book

The metal-oxide-semiconductor field-effect transistor (MOSFET, MOS-FET, or MOS FET) is a device used to amplify or switch electronic signals. It is by far the most common field-effect transistor in both digital and analog circuits. The MOSFET is composed of a channel of n-type or p-type semiconductor material, and is accordingly called an NMOSFET or a PMOSFET (also commonly nMOSFET, pMOSFET. The width of the channel, which determines how well the device conducts, is controlled by an electrode called the gate, separated from channel by a thin layer of oxide insulation. The insulation keeps current from flowing between the gate and channel. MOSFETs are useful for high-speed switching applications and also on integrated circuits in computers.

Table of Contents:
Preface; Novel Device Concepts to Overcome MOSFET Limits; Efficient Parallel Monte Carlo Simulations Using Finite Element Tetrahedral Meshes for Novel Thin-Body MOSFET Architectures; Cryogenic Operation of Power MOSFETs; Redesign and Optimisation of Semiconductor Devices and Circuits; Thin and Ultra-Thin SiO2 Gate Oxide in Metal-Oxide-Semiconductor Structors Under Electrical Stresses: Reliability Predictions and Degradation Mechanism Models; Some Medical Applications of MOSFETs in Radiation Therapy: Surface Dose and Electron Backscatter Measurements with Monte Carlo Simulations; Surrounding-Gate MOSFETs for Transistor Scaling: Devices, Fabrication and Modelling; Quantum, Self Heating and Hot Electron Effects of Si-Based Double-Gate MOSFET and GaN-Based MOS-HFET; Bulk FinFETs: Fabrication and Threshold Voltage; Discussion on 1/f Noise in CMOS Transistors: Modelling- Simulation and Measurement Techniques; A Rigorous Analysis of the Parameters Which Govern the Silc in MOSFET's with Oxide Thickness in the 1-2 Nanometer Range; Analog and Digital Circuit Functionality Under the Influence of Gate Oxide Degradation and Breakdown; MOSFET's Programmable Conductance: The Way of VLSI Implementation for Emerging Applications from Biologically Plausible Neuromorphic Devices to Mobile Communications; Index.


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Product Details
  • ISBN-13: 9781604567625
  • Publisher: Nova Science Publishers Inc
  • Publisher Imprint: Nova Science Publishers Inc
  • Height: 180 mm
  • No of Pages: 454
  • Sub Title: Properties, Preparations & Performance
  • Width: 260 mm
  • ISBN-10: 1604567627
  • Publisher Date: 01 Dec 2008
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Weight: 1088 gr


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