Understand the principles and applications of surface analysis
Analyzing the composition of a given surface is a crucial aspect of materials science, with significant bearing on the way a material will interact with a particular environment. Surface analysis draws upon a substantial body of research to analyze the outer few nanometres of a material, and has considerable significance in laboratories studying corrosion, adhesion, polymer surface treatment and more.
Surface Analysis offers a comprehensive and accessible overview of the characterization and analysis of outer substrate layers. It brings together experts in each analysis area to lay out foundational theory, offer practical applications, and provide examples. Now fully up to date and reflecting the latest research, it is a must-own for any scientist incorporating surface analysis into laboratory work.
Readers of the third edition of Surface Analysis readers will also find:
- Two new chapters on advanced mass spectrometry methods
- Detailed coverage of ever-more-important methods of data analysis
- Tools for concretely improving laboratory and research outcomes
Surface Analysis is ideal for practitioners and advanced graduate students in materials science, solid state physics, optics, and chemistry.
Table of Contents:
1 Introduction
1.1 How do we Define the Surface?
1.2 How Many Atoms in a Surface?
1.3 Information Required
1.4 Surface Sensitivity
1.5 Radiation Effects – Surface Damage
1.6 Complexity of the Data
2 Electron Spectroscopy for Chemical Analysis
2.1 Overview
2.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids
2.3 Binding Energy and the Chemical Shift
2.4 Inelastic Mean Free Path and Sampling Depth
2.5 Quantification
2.6 Spectral Features
2.7 Instrumentation
2.8 Spectral Quality
2.9 Depth Profiling
2.10 X–Y Mapping and Imaging
2.11 Chemical Derivatization
2.12 Valence Band
2.13 Perspectives
2.14 Conclusions Acknowledgements References Problems
3 Molecular Surface Mass Spectrometry by SIMS
3.1 Introduction
3.2 Basic Concepts
3.3 Experimental Requirements
3.4 Secondary Ion Formation
3.5 Modes of Analysis
3.6 Ionization of the Sputtered Neutrals
3.7 Ambient Methods of Desorption Mass Spectrometry References
Problems
4 Secondary Ion Mass Spectrometry – Depth Profiling Theory and Applications [NEW]
5 Mass Spectrometry Imaging by MALDI and Ambient Methods [NEW]
6 Low-Energy Ion Scattering and Rutherford Backscattering
6.1 Introduction
6.2 Physical Basis
6.3 Rutherford Backscattering
6.4 Low-Energy Ion Scattering Acknowledgement
References Problems Key Facts
7 Vibrational Spectroscopy from Surfaces
7.1 Introduction
7.2 Infrared Spectroscopy from Surfaces
7.3 Electron Energy Loss Spectroscopy (EELS)
7.4 The Group Theory of Surface Vibrations
7.5 Laser Raman Spectroscopy from Surfaces
7.6 Inelastic Neutron Scattering (INS)
7.7 Sum-Frequency Generation Methods References
Problems
8 Surface Structure Determination by Interference Techniques
8.1 Introduction
8.2 Electron Diffraction Techniques
8.3 X-ray Techniques
8.4 Photoelectron Diffraction References
9 Scanning Probe Microscopy
9.1 Introduction
9.2 Scanning Tunnelling Microscopy
9.3 Atomic Force Microscopy
9.4 Scanning Near-Field Optical Microscopy
9.5 Other Scanning Probe Microscopy Techniques
9.6 Lithography Using Probe Microscopy Methods
9.7 Conclusions References Problems
10 The Application of Multivariate Data Analysis Techniques in Surface Analysis
10.1 Introduction
10.2 Basic Concepts
10.3 Factor Analysis for Identification
10.4 Regression Methods for Quantification10.5 Methods for Classification
10.6 Summary and Conclusion Acknowledgements References
Problems
Appendix 1 Vacuum Technology for Applied Surface Science
A1.1 Introduction: Gases and Vapours
A1.2 The Pressure Regions of Vacuum Technology and their Characteristics
A1.3 Production of a Vacuum
A1.4 Measurement of Low Pressures Acknowledgement
References
Appendix 2 Units, Fundamental Physical Constants and Conversions
A2.1 Base Units of the SI
A2.2 Fundamental Physical Constants A2.3 Other Units and Conversions to SI References
Index
About the Author :
John C. Vickerman, PhD, DSc, is Professor Emeritus at the University of Manchester in the Surface Analysis Research Centre. He got his PhD in Surface Chemistry at the University of Bristol and held postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. He is known as a pioneer and international leader in the development of surface analysis by secondary ion mass spectrometry (SIMS).
Ian Gilmore, PhD, is a Principal Research Scientist in the Surface and Nano-Analysis Research team at the National Physical Laboratory in Teddington, UK. He received his PhD from the University of Loughborough in 2000. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static SIMS called gentle- SIMS or G-SIMS. Ian is a Fellow of the Institute of Physics, a member of the EPSRC College and a member of the American Vacuum Society.
