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Home > Art, Film & Photography > Failure: Power Failure Transfer, Failure Modes of Electronics, Reliability Engineering, Quantum Byzantine Agreement, System Accident
Failure: Power Failure Transfer, Failure Modes of Electronics, Reliability Engineering, Quantum Byzantine Agreement, System Accident

Failure: Power Failure Transfer, Failure Modes of Electronics, Reliability Engineering, Quantum Byzantine Agreement, System Accident


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About the Book

Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Pages: 49. Chapters: Power failure transfer, Failure modes of electronics, Reliability engineering, Quantum Byzantine agreement, System accident, Failure rate, Mulligan, Byzantine fault tolerance, Cascading failure, J integral, Reliability theory of aging and longevity, Downtime, Tsai-Wu failure criterion, Failure analysis, Damage tolerance, Residual stress, Failure of imagination, Customer support, Catastrophic failure, Accident analysis, Submarine depth ratings, Failure causes, Bathtub curve, Mean down time, Failure Reporting, Analysis and Corrective Action Systems, Failing badly, Mean time to recovery, Fail-fast, CTQ tree, Annualized failure rate, Marine accident investigation, Mechanical overload, Mean time to repair, Failure Semantics, Process decision program chart, Switchover, Mean time to first failure, Serviceability failure, Non-event, Lusser's law, Steam rupture. Excerpt: Electronic components have a wide range of failure modes. These can be classified by their development in time (sudden failure or gradual degradation), by environmental causation (e.g. corrosion, ionizing radiation) or by an electrical parameter which was exceeded (e.g. electrostatic discharge, overvoltage, overcurrent, etc.). Failures most commonly occur at the beginning and near the end of the lifetime of the parts, resulting in the classic bathtub curve graph of failure rates. Burn-in procedures are used to detect early failures. Presence of parasitic structures, irrelevant for normal operation, may become important in the context of failures; such structures can be both a source of failure or a protective device. A sudden fail-open fault can cause multiple secondary failures, when the event is fast and the circuit contains an inductance. The suddenly interrupted current flow in combination with the inductance then causes large voltage spikes, which for v...


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Product Details
  • ISBN-13: 9781156771204
  • Publisher: Books LLC, Wiki Series
  • Publisher Imprint: Books LLC, Wiki Series
  • Height: 246 mm
  • No of Pages: 50
  • Spine Width: 3 mm
  • Weight: 109 gr
  • ISBN-10: 115677120X
  • Publisher Date: 13 Aug 2011
  • Binding: Paperback
  • Language: English
  • Returnable: N
  • Sub Title: Power Failure Transfer, Failure Modes of Electronics, Reliability Engineering, Quantum Byzantine Agreement, System Accident
  • Width: 189 mm


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