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Home > Art, Film & Photography > Hardware Testing: Acceptance Testing, Black-Box Testing, Joint Test Action Group, Environmental Stress Screening, Automatic Test Equipment
Hardware Testing: Acceptance Testing, Black-Box Testing, Joint Test Action Group, Environmental Stress Screening, Automatic Test Equipment

Hardware Testing: Acceptance Testing, Black-Box Testing, Joint Test Action Group, Environmental Stress Screening, Automatic Test Equipment


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About the Book

Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Pages: 41. Chapters: Acceptance testing, Black-box testing, Joint Test Action Group, Environmental stress screening, Automatic test equipment, Automated optical inspection, Test engineer, Design For Test, Boundary scan, Corelis, Bead probe technology, Inquisitor, Integration testing, Enterprise test software, In-circuit functional tester, Negative bias temperature instability, Testbed, System testing, ESD Simulator, Burn-in, Analog verification, White-box testing, Boundary scan description language, List of Intel manufacturing sites, Automated x-ray inspection, Fixtureless in-circuit test, Ongoing reliability test, Device under test, Final Quality Audit Process, PBIST, FCT, PlanetLab, Flying probe, Diagnostic design specification, Continuity test, Analog signature analysis, Mixed flowing gas, Manufacturing test requirement design specification, Spy-Bi-Wire, Power-off testing, Fault grading, Test mode, Debug port, Manufacturing Compatibility Analysis. Excerpt: Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces. JTAG was an industry group formed in 1985 to develop a method to test populated circuit boards after manufacture. At the time, multi-layer boards and non-lead-frame ICs were becoming s...


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Product Details
  • ISBN-13: 9781155202679
  • Publisher: Books LLC, Wiki Series
  • Publisher Imprint: Books LLC, Wiki Series
  • Height: 246 mm
  • No of Pages: 42
  • Spine Width: 2 mm
  • Weight: 95 gr
  • ISBN-10: 1155202678
  • Publisher Date: 29 Aug 2011
  • Binding: Paperback
  • Language: English
  • Returnable: N
  • Sub Title: Acceptance Testing, Black-Box Testing, Joint Test Action Group, Environmental Stress Screening, Automatic Test Equipment
  • Width: 189 mm


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